超薄锡掺杂氧化镓结合高k栅介质:硅基兼容的4英寸功率场效应晶体管阵列
Ultrathin Sn-doped Ga_(2)O_(3)for power field-effect transistors:Si-compatible 4-inch array with high-k gate dielectric作者机构:School of Integrated Circuits and Electronics and Yangtze Delta Region AcademyBeijing Institute of TechnologyBeijing 100081China Department of Electrical and Electronic EngineeringThe University of Hong KongHong Kong 999077China R&D Center for Solid-state LightingInstitute of SemiconductorsChinese Academy of SciencesBeijing 100083China
出 版 物:《Science Bulletin》 (科学通报(英文版))
年 卷 期:2024年第69卷第12期
页 面:1848-1851页
核心收录:
学科分类:080903[工学-微电子学与固体电子学] 081702[工学-化学工艺] 0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学] 0817[工学-化学工程与技术] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程(可授工学、理学学位)] 080502[工学-材料学]
基 金:supported by the National Key R&D Program of China(2023YFB3611700) the National Natural Science Foundation of China(92163206,62101044,12321004)
摘 要:Gallium oxide(Ga_(2)O_(3)),a novel ultrawide-bandgap(UWBG)semiconductor,has attracted considerable attention owing to its large bandgap of up to 4.9 eV,a high breakdown electric field of 8 MV/cm,and a high Baliga s figure of merit exceeding 3000[1,2].These remarkable properties strongly support its potential applications in power electronics,extreme environmentresistance devices,and solar-blind detectors[1–3].