SMILE soft X-ray Imager flight model CCD370 pre-flight device characterisation

作     者：S.Parsons D.J.Hall O.Hetherington T.W.Buggey T.Arnold M.W.J.Hubbard A.Holland S.Parsons;D.J.Hall;O.Hetherington;T.W.Buggey;T.Arnold;M.W.J.Hubbard;A.Holland

作者机构：Centre for Electronic Imagingthe Open UniversityMilton KeynesMK76AAUK 

出 版 物：《Earth and Planetary Physics》 (地球与行星物理（英文版）)

年 卷 期：2024年第8卷第1期

页      面：25-38页

核心收录：

学科分类：07[理学] 0708[理学-地球物理学] 070401[理学-天体物理] 0704[理学-天文学] 

基　　金：SMILE 2019-2022 STFC(Grant reference:ST/T003138/1) SMILE 2022-2023 ESA(Contract No:4000138219/22/NL/BW/pbe)。 

主　　题：CCD soft X-ray imager characterisation SMILE 

摘      要：Throughout the SMILE mission the satellite will be bombarded by radiation which gradually damages the focal plane devices and degrades their performance.In order to understand the changes of the CCD370s within the soft X-ray Imager,an initial characterisation of the devices has been carried out to give a baseline performance level.Three CCDs have been characterised,the two flight devices and the flight spa re.This has been carried out at the Open University in a bespo ke cleanroom measure ment facility.The results show that there is a cluster of bright pixels in the flight spa re which increases in size with tempe rature.However at the nominal ope rating tempe rature(-120℃) it is within the procure ment specifications.Overall,the devices meet the specifications when ope rating at -120℃ in 6 × 6 binned frame transfer science mode.The se rial charge transfer inefficiency degrades with temperature in full frame mode.However any charge losses are recovered when binning/frame transfer is implemented.