反铁磁成像的叠层相位恢复方法
Antiferromagnetic imaging via ptychographic phase retrieval作者机构:School of Materials Science and EngineeringTsinghua UniversityBeijing 100084China MOE Key Laboratory of Advanced MaterialsTsinghua UniversityBeijing 100084China State Key Laboratory of New Ceramics and Fine ProcessingTsinghua UniversityBeijing 100084China
出 版 物:《Science Bulletin》 (科学通报(英文版))
年 卷 期:2024年第69卷第4期
页 面:466-472页
核心收录:
学科分类:080801[工学-电机与电器] 0808[工学-电气工程] 08[工学] 080203[工学-机械设计及理论] 0805[工学-材料科学与工程(可授工学、理学学位)] 080502[工学-材料学] 0802[工学-机械工程] 0702[理学-物理学]
基 金:supported by the National Natural Science Foundation of China(52388201 and 51525102) the support from the Physical Sciences Center and Center of High-Performance Computing,Tsinghua University
主 题:Antiferromagnetic imaging Magnetic lattice Ptychography Electron microscopy
摘 要:Antiferromagnetic imaging is critical for understanding and optimizing the properties of antiferromagnetic materials and *** the widespread use of high-energy electrons for atomic-scale imaging,they have low sensitivity to spin ***,the magnetic contribution to the phase of a highenergy electron wave is weaker than one percent of the electrostatic ***,we demonstrate direct imaging of antiferromagnetic lattice through precise phase retrieval via electron ptychography,paving the way for magnetic lattice imaging of antiferromagnetic materials and devices.