MATERIAL ELECTROMAGNETIC PARAMETERS EXTRACTION USING SVM METHOD

作     者：Xiao Huaibao Lu guizhen Li Yanfei 

作者机构：Communication University of China Beijing 100024 China 

出 版 物：《Journal of Electronics(China)》 (电子科学学刊（英文版）)

年 卷 期：2010年第27卷第4期

页      面：544-547页

学科分类：080801[工学-电机与电器] 0808[工学-电气工程] 08[工学] 080203[工学-机械设计及理论] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 0802[工学-机械工程] 

基　　金：Supported by the Project of National Key Laboratory Fund 

主　　题：Support Vector Machine (SVM) Permittivity Parameters extraction Scattering parameters 

摘      要：The method extracting the electromagnetic parameters from scattering coefficients was studied in this paper. The Support Vector Machine (SVM) method is used to solve the inverse problem of parameters extraction. The mapping relationship is set up by calculating a large number of S pa-rameters from the samples with different permittivity by using transmission line theory. The simulated data set is used as training data set for SVM. After the training, the SVM is used to predict the permittivity of material from the scattering coefficients.