The Study of Microchannel Plate Gain Using SIMION

作     者：Yifan Zhao 

作者机构：Shanghai Jianping High School Shanghai China 

出 版 物：《Open Journal of Modelling and Simulation》 (建模与仿真（英文）)

年 卷 期：2020年第8卷第1期

页      面：1-17页

学科分类：08[工学] 0804[工学-仪器科学与技术] 

主　　题：Microchannel Plate SIMION Secondary Emission Ion Simulation 

摘      要：Microchannel plates (MCP) are widely used for particle detection. The gain of chevron MCPs is related to geometrical parameters, but no study has been done through SIMION simulation. The purpose of this study is to model a chevron MCP and its secondary emission process using SIMION and determine the relationship between microchannel plate gain, voltage, channel bias angle, and diameter. Two geometry files simulated MCP electric field and shape, and a Lua program simulated secondary emission. Simulation results showed that MCP gain is proportional to voltage, angles between 5 and 15 degrees maximize gain, and gain is inversely proportional to the diameter. This study accurately simulates a chevron MCP and yields the relationship between gain, voltage, channel bias angle, and diameter. Further studies are needed to simulate electron trajectories for improved precision.