Metallographic sample prepared by ion beam etching

作     者：XU Xiang-yang ZHANG Kun HAN Jian-min CHEN Guang-nan 

作者机构：Institute of Materials Science & Engineering Beijing Jiaotong University Beijing 100044 China Institute of Mechanics Chinese Academy of Sciences Beijing 100080 China Institute of Mechanics Chinese Academy of Sciences Beijing 100080 China Institute of Materials Science & Engineering Beijing Jiaotong University Beijing 100044 China 

出 版 物：《中国有色金属学会会刊：英文版》 (Transactions of Nonferrous Metals Society of China)

年 卷 期：2004年第14卷第Z1期

页      面：282-285页

核心收录：

学科分类：081702[工学-化学工艺] 08[工学] 0817[工学-化学工程与技术] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）] 

基　　金：Prior Research Project of Science and Technology Commission of Defensive Industry of China(40404120204) 

主　　题：ion beam etching metallography microstructure electroplating chromium 

摘      要：Ion beam etching technique was used to reveal the metallograhpic microstructure and interface morphology of electroplating chromium coating, in particular, whose substrate surface layer was treated in advance by laser quenching. Chemical etchings were also conducted for comparison. The reveal microstructures were observed and analyzed by scanning electron microscopy. The results show that ion beam etching can reveal well the whole microstructures of composite coating-substrate materials.