Deterministic Dual Control of Phase Competition in Strained BiFeO_(3):A Multiparametric Structural Lithography Approach

作     者：Nathan Black David Edwards Niall Browne Joseph G.M.Guy Niyorjyoti Sharma Kristina M・Holsgrove Aaron B.Naden Raymond G.P.McQuaid Brian J.Rodriguez Amit Kumar 

作者机构：School of Maths and PhysicsQueen's University BelfastBelfast BT7 INNUK School of ChemistryUniversity of St.AndrewsSt Andrews KY169STUK School of PhysicsUniversity College DublinBelfieldDublin 4Ireland 

出 版 物：《Nanomanufacturing and Metrology》 (纳米制造与计量（英文）)

年 卷 期：2022年第5卷第1期

页      面：60-66页

核心收录：

学科分类：08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 

基　　金：UK Research and Innovation,MR/T043172/1 Raymond G.P.McQuaid Department for Employment and Learning,Northern Ireland,USI-082 Amit Kumar Engineering and Physical Sciences Research Council,EP/S037179/1 Amit Kumar EP/LO15323/01,Nathan Black. 

主　　题：Phase competition Ferroelectric Stress Lithography 

摘      要：The realization of a mixed-phase microstructure in strained BiFeO_(3)(BFO)thin films has led to numerous novel effects derived from the coexistence of the tetragonal-like monoclinic phase(T phase)and rhombohedral-like monoclinic phase(R phase).Strong strain and polarization diiferences between the phases should result in a high level of transformation plasticity,which enables the continuous alteration of the relative proportion of R and T states in response to external forces.Although the potential for utilizing such plasticity to control mixed-phase populations under external stimuli is evident,direct experi・mental evidence backed by equilibrium predictions has not yet been fully demonstrated.Here we demonstrate deterministic control of mixed-phase populations in an epitaxially strained BFO thin film through the application of localized stresses and electric fields in a reversible manne匚The results illustrate and rationalize deterministic control of mixed phases in strained BFO films,which could be crucial in tuning their functional properties.The findings also highlight a new multiparametric technique in the scanning probe lithography toolbox based on tip-assisted electric and strain field manipulation of functional properties that might find application beyond the ferroelectric domain and structural phase lithography.