STRAIN RATE SENSITIVITY OF ULTRAFINE-GRAINED Cu WITH NANOSIZED TWINS

作     者：L.X. Liu X.H. Chen L. Lu 

作者机构：Shenyang National Laboratory for Materials Science Institute of Metal Research Chinese Academy of Sciences Shenyang 110016 China 

出 版 物：《Acta Metallurgica Sinica(English Letters)》 (金属学报（英文版）)

年 卷 期：2006年第19卷第5期

页      面：313-318页

核心收录：

学科分类：08[工学] 080502[工学-材料学] 0805[工学-材料科学与工程（可授工学、理学学位）] 

基　　金：This work was supported by the National Natural Science Foundation of China(No.50571096 50021101,50431010) the Ministry of Science and Technology(M0ST)of China(No 2005CB623604) 

主　　题：copper nanosized twin strain rate sensitivity deformation mechanism 

摘      要：An ultrafine-grained Cu sample with a high density of growth twins was synthesized by means of pulsed electrodeposition technique. The strain rate sensitivity of the Cu sample was measured by strain rate cycling tests under tension. The effects of grain size as well as twin density on the strength and strain rate sensitivity were discussed.