Quality assurance test and failure analysis of SiPM arrays of GECAM satellites

作     者：D.L.Zhang M.Gao X.L.Sun X.Q.Li Z.H.An X.Y.Wen C.Cai Z.Chang G.Chen C.Chen Y.Y.Du R.Gao K.Gong D.Y.Guo J.J.He D.J.Hou Y.G.Li C.Y.Li G.Li L.Li X.F.Li M.S.Li X.H.Liang X.J.Liu Y.Q.Liu F.J.Lu H.Lu B.Meng W.X.Peng F.Shi H.Wang J.Z.Wang Y.S.Wang H.Z.Wang X.Wen S.Xiao S.L.Xiong Y.B.Xu Y.P.Xu S.Yang J.W.Yang Fan.Zhang S.N.Zhang C.Y.Zhang C.M.Zhang Fei Zhang X.Y.Zhao X.Zhou D.L.Zhang;M.Gao;X.L.Sun;X.Q.Li;Z.H.An;X.Y.Wen;C.Cai;Z.Chang;G.Chen;C.Chen;Y.Y.Du;R.Gao;K.Gong;D.Y.Guo;J.J.He;D.J.Hou;Y.G.Li;C.Y.Li;G.Li;L.Li;X.F.Li;M.S.Li;X.H.Liang;X.J.Liu;Y.Q.Liu;F.J.Lu;H.Lu;B.Meng;W.X.Peng;F.Shi;H.Wang;J.Z.Wang;Y.S.Wang;H.Z.Wang;X.Wen;S.Xiao;S.L.Xiong;Y.B.Xu;Y.P.Xu;S.Yang;J.W.Yang;Fan.Zhang;S.N.Zhang;C.Y.Zhang;C.M.Zhang;Fei Zhang;X.Y.Zhao;X.Zhou

作者机构：Institute of High Energy PhysicsCASBeijing 100049People’s Republic of China 

出 版 物：《Radiation Detection Technology and Methods》 (辐射探测技术与方法（英文）)

年 卷 期：2022年第6卷第1期

页      面：35-42页

核心收录：

学科分类：08[工学] 082503[工学-航空宇航制造工程] 0825[工学-航空宇航科学与技术] 

基　　金：This research is supported by the Strategic Priority Research Program of Chinese Academy of Sciences Grant No.XDA15360102 

主　　题：Gravitational waves Gamma-ray detectors Silicon photomultipliers Quality assurance test Failure analysis 

摘      要：Background The Gravitational wave high-energy Electromagnetic Counterpart All-sky Monitor(GECAM)satellite developed a SiPM-based gamma-ray detector to monitor the gravitational wave-related GRBs and guide subsequent observations in other wavelengths of *** As all the available SiPM devices belong to commercial grade,quality assurance tests need to be performed in accordance with the aerospace *** In the SiPM application of GECAM,quality assurance experiments were *** mechanism of the failure of SiPM devices was analyzed during the development *** Based on the quality assurance test results,the fnal pass rate of SiPM array was 95%.Based on the failure analysis,it was found that a piece of SiPM had a leakage channel after longtime operation due to device *** According to the accumulated experience,in the reliability test of SiPM,it is necessary to pay special attention to test the impedance of each pin of SiPM to ground and confrm that the power switch state of SiPM is controllable.