Optical properties of cobalt xanthate films on different substrates

作     者：I.A.Kariper T.zpozan 

作者机构：Education FacultyErciyes University Chemistry DepartmentScience FacultyErciyes University 

出 版 物：《International Journal of Minerals,Metallurgy and Materials》 (矿物冶金与材料学报（英文版）)

年 卷 期：2014年第21卷第7期

页      面：736-740页

核心收录：

学科分类：0709[理学-地质学] 0819[工学-矿业工程] 07[理学] 070205[理学-凝聚态物理] 08[工学] 0806[工学-冶金工程] 0708[理学-地球物理学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0703[理学-化学] 0802[工学-机械工程] 0801[工学-力学（可授工学、理学学位）] 0702[理学-物理学] 

基　　金：supported by Erciyes University(BAP) FBD-11-4 

主　　题：thin films cobalt compounds xanthates chemical deposition optical properties 

摘      要：Cobalt isopropyl xanthate thin films （CXTFs） were deposited via chemical bath deposition onto different substrates：commercial glass （CG）, indium tin oxide （ITO）, and poly（methyl methacrylate） （PMM）. Isopropyl xanthate was synthesized according to a method described in the literature. The cobalt nitrate and isopropyl xanthate were mixed in a beaker, which allowed the thin films to be deposited via a simple ion-ion mechanism. The transmission, reflectivity, refractive index, dielectric constant, and optical conductivity were investigated for various thin films coated onto different substrates. An ultraviolet-visible spectrophotometer was used to measure the optical properties of the thin films. The lowest value of the transmission and the highest value of the refractive index were observed for the thin films deposited onto PMM. The structure of the cobalt xanthate was characterized by Fourier transform infrared （FTIR） spectroscopy, which was measured using a Perkin-Elmer Spectrum 400 spectrometer. The stretching vibration of the Co-S bonds was observed at 359 cm^-1 in the FTIR spectrum of the CXTFs.