The effect of interface roughness on the perpendicular exchange bias of NiO/CoPt/Pt stacking structure

作     者：GAO Ying HARUMOTO Takashi NAKAMURA Yoshio SHI Ji GAO Ying;HARUMOTO Takashi;NAKAMURA Yoshio;SHI Ji

作者机构：Department of Materials Science and EngineeringTokyo Institute of Technology2-12-1OokayamaMeguro-kuTokyo 152-8550Japan 

出 版 物：《Science China(Technological Sciences)》 (中国科学（技术科学英文版）)

年 卷 期：2021年第64卷第3期

页      面：605-610页

核心收录：

学科分类：08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 080502[工学-材料学] 

主　　题：perpendicular exchange bias interface roughness FM thickness blocking temperature 

摘      要：An orthogonal coupling structure of NiO/CoPt/Pt/glass with perpendicular exchange bias effect has been *** exchange bias is found to be strongly dependent on the interface roughness between NiO and CoPt *** conventional inverse proportionality of the exchange bias field with the ferromagnetic thickness is not applicable to this top-pinned stacking ***,an anomalous ferromagnetic thickness dependence of blocking temperature is also observed.A simulation on the basis of a spin configuration model with defects at the interface agrees well with the experimental *** findings suggest considerable contribution of the interface roughness to the perpendicular exchange bias.