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检索条件"机构=TNO Holst Centre"
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Curved digital X-ray detectors
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npj Flexible Electronics 2020年 第1期4卷 185-192页
作者: Albert JJMvan Breemen Matthias Simon Olivier Tousignant Santhosh Shanmugam Jan-Laurens van der Steen Hylke B.Akkerman Auke Kronemeijer Walter Ruetten Rob Raaijmakers Lex Alving Jan Jacobs Pawel E.Malinowski Florian De Roose Gerwin H.Gelinck holst centre/tno EindhovenThe Netherlands Philips Research EindhovenThe Netherlands Philips Healthcare BestThe Netherlands imec LeuvenBelgium Department of Applied Physics Technical University EindhovenEindhovenThe Netherlands Teledyne Dalsa EindhovenThe Netherlands
A curved image sensor on plastic foil has been developed for cone beam computed tomography(CBCT)X-ray *** image sensor of about 6×8 cm^(2) size has been built on a thin polyimide foil with an indium gallium zinc oxid... 详细信息
来源: 维普期刊数据库 维普期刊数据库 评论
Precision in harsh environments
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Microsystems & Nanoengineering 2016年 第1期2卷 61-72页
作者: Paddy French Gijs Krijnen Fred Roozeboom Faculty of Electrical Engineering Mathematics and Computer ScienceTU DelftDelftThe Netherlands Faculty of Electrical Engineering Mathematics and Computer ScienceTwente UniversityEnschedeThe Netherlands Eindhoven University of Technology Department of Applied PhysicsPO Box 5135600 MBEindhovenThe Netherlands tno holst centre High Tech Campus 215656 AEEindhovenThe Netherlands
Microsystems are increasingly being applied in harsh and/or inaccessible environments,but many markets expect the same level of functionality for long periods of *** environments cover areas that can be subjected to h... 详细信息
来源: 维普期刊数据库 维普期刊数据库 评论