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Effects of Zr content on electrochemical performance of Ti/Sn-Ru-Co-ZrO_(x)electrodes

International Journal of Minerals,Metallurgy and Materials 2022年第12期29卷 2181-2188页

作者： Linhui Chang Sheng Chen Xionghui Xie Buming Chen Haihong Qiao Hui Huang Zhongcheng Guo Ruidong Xu Faculty of Metallurgical and Energy Engineering Kunming University of Science and TechnologyKunming 650093China Research Center of Metallurgical Electrode Materials Engineering technology Kunming 650106China Kunming Hendera science and technology Co. Ltd.Kunming 650106China north night vision technology Research Institute group Co. Ltd.Optical CompanyKunming 650093China

The low cell voltage during electrolytic Mn from the MnCl_(2) system can effectively reduce the power *** this work,the Ti/Sn−Ru−Co−Zr modified anodes were obtained by using thermal decomposition *** physical parameters of coatings were observed by SEM(scanning electron microscope).Based on the electrochemical performance and SEM/XRD(X-ray diffraction)of the coatings,the influence of Zr on electrode performance was studied and *** the mole ratio of Sn−Ru−Co−Zr is 6:1:0.8:0.3,the cracks on the surface of coatings were the smallest,and the compactness was the best due to the excellent filling effect of ZrO_(2)***,the electrode prepared under this condition had the lowest mass transfer resistance and high chloride evolution activity in the 1mol%NH_(4)Cl and 1.5mol%HCl *** service life of 3102 h was achieved according to the empirical formula of accelerated-life-test of the new type anode.

关键词： Ti/Sn−Ru−Co−Zr anode electrochemical Mn electrowinning manganese chloride system service life

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Test and analysis of the halo in low-light-levelimage intensifiers

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Chinese Optics Letters 2012年第6期10卷 1-3页

作者：崔东旭任玲石峰史继芳钱芸生王洪刚常本康 Institute of Electronic Engineering and Optoelectronic technology Nanjing University of Science and Technology Xi'an Institute of Applied Optics science and technology on Low-Light-Level night vision Laboratory north night vision technology group Co. Ltd

A halo tester is designed to analyze the halo formation in low-light-level（LLL） image intensifiers and the influencing factors on halo *** tester is used to collect a 0.1922-mm hole image directly using a CoolSNAPK4 charge-coupled device（CCD） in a darkroom under illumination conditions between 10？2 and 10？4 *** practical measurement result shows that the amplification ratio is ***,the super second-and third-generation image intensifiers are placed after the hole,and the halo sizes of the hole images on the screens are determined as 0.2388 and 0.5533 mm,respectively.

关键词： Optics Physics

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Theoretical Revision and Experimental Comparison of Quantum Yield for Transmission-Mode GaAlAs/GaAs Photocathodes

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Chinese Physics Letters 2011年第4期28卷 105-107页

作者：石峰张益军程宏昌赵静熊雅娟常本康 Institute of Electronic Engineering and Optoelectronic technology Nanjing University of Science and TechnologyNanjing 210094 north night vision technology group Co. LTDXi’an 710056 Key Laboratory of Low Light Level technology of COSTIND Xi’an 710065

The quantum yield formula for uniform-doping GaAIAs/GaAs transmission-mode photocathodes is revised by taking into account the light absorption in the window *** using the revised quantum yield formula,the domestic and ITT's experimental quantum yield curves are fitted and the fitted curves match well with the experimental *** addition,the fit results show that the integral sensitivity and quantum yield of domestic image intensifier tube has achieved 2130μA/lm and 45%,nearly reaching ITT's third generation level in 2002,whereas the discrepancy in cathode performance is mainly embodied in the electron diffusion length and back interface recombination velocity.

关键词： quantum fitted revised

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The powder layer design of high performance image intensifier phosphor screen

The powder layer design of high performance image intensifie...

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国防光电子论坛第二届新型探测技术及其应用研讨会

作者： Shilong Li Feng Shi Taimin Zhang Zhaolu Liu Xiaojian Liu Jing Nie Xiaohui Zhang Fan Zhang Dan Li science and technology on Low-Light-Level night vision Laboratory north night-vision science & technology group corp. ltd.

The high performance phosphor screen can effectively enhance the performance of low light level image *** performance of phosphor Screen mainly depends on the nature of the powder layer. The powder layer is essentially formed by the accumulation of phosphor grains, and therefore the related character research of the powder layer refers to powder stacking theory is helpful to guide the actual production process to obtain higher quality powder layer, thereby enhancing the performance of the screen. Therefore, this article made a theoretical analysis of the powder layer density based on the classic powder stacking theory, and combined with the actual production made some further related studies for the best powder layer thickness of a certain type of phosphor. The result shows that the powder layer first should be possible to achieve the optimum thickness, and then make the density to the maximum, so can obtain the better powder layer, hence, the performance of phosphor screen will get better.

关键词： phosphor screen powder layer compact density thickness

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Compound semiconductor component analysis by photoluminescence system

Compound semiconductor component analysis by photoluminescen...

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国防光电子论坛第二届新型探测技术及其应用研讨会

作者： Cheng Wei Hu Cang-lu Xu Xiao-bing Liu Feng Zhou Yu-jian Feng Chi Peng Cha-xia science and technology on Low-Light-Levei night vision Laboratory north night vision science & technology group Co.ltd

Photoluminescence(PL) measurements were performed at room temperature and specially scanned PL were also studied. GaAs and GaAsP material PL curve were discussed because of their different curve peaks. Ga1-xAlxN doping content was calculated by it’s PL peak value. The uniformity of GaAs material was obtained by PL Mapping measurement. From the results of the PL spectra measured, we suggest PL measurement as a nondestructive inspection method for Ga As substrates can be used in high performance GaAs IC product.

关键词： GaAlAs GaAsGa1-xAlxN Inpurity and defect photoluminescence

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