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In situ observation of atomic movement in a ferroelectric film under an external electric field and stress

Nano Research 2018年第7期11卷 3824-3832页

作者： Hyeon Jun Lee Er-Jia Guo Taewon Min Seung Hyun Hwang Su Yong Lee Kathrin Dorr Jaekwang Lee Ji Young Jo School of Materials Science and Engineering Gwangju Institute of Science and Technology Gwangju 61005 Republic of Korea Quantum Condensed Matter Division Oak Ridge National Laboratory Oak Ridge TN 37830 USA Institute for Physics Martin-Luther-University Halle-Wittenberg Halle 06099 Germany Department of Physics Pusan National University Busan 46241 Republic of Korea Pohang AccelerotorLaboratory Pohang 37673 Republic of Korea

Atomic movement under application of external stimuli （i.e., electric field or mechanical stress） in oxide materials has not been observed due to a lack of experimental methods but has been well known to determine the electric polarization. Here, we investigated atomic movement arising from the ferroelectric response of BiFeO3 thin films under the effect of an electric field and stress in real time using a combination of switching spectroscop）6 time-resolved x-ray microdiffraction, and in situ stress engineering. Under an electric field applied to a BiFeO3 film, the hysteresis loop of the reflected x-ray intensity was found to result from the opposing directions of displaced atoms between the up and down polarization states. An additional shift of atoms arising from the linearly increased dielectric component of the polarization in BiFeO3 was confirmed through gradual reduction of the diffracted x-ray intensity. The electric-field- induced displacement of oxygen atoms was found to be larger than that of Fe atom for both ferroelectric switching and increase of the polarization. The effect of external stress on the BiFeO3 thin film, which was controlled by applying an electric field to the highly piezoelectric substrate, showed smaller atomic shifts than for the case of applying an electric field to the film, despite the similar tetragonality.

关键词： in situ measurement atomic displacementunder electric field time-resolved x-ray microdiffraction ferroelectrics in situ strain engineering

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