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PROGRAMMABLE LOGIC ARRAYS WITH THE PROPERTIES OF EASY TEST GENERATION

Science China Mathematics 1990年第12期33卷 1501-1518页

作者：闵应骅 Center for Fault-tolerant Computing CAD Laboratory Institute of Computing Technology Academia Sinica Beijing 100080 PRC

Programmable logic array (PLA) is a popular structure for realizing arbitrary combinational networks. Easy test generation (ETG) PLA, a kind of PLA design with the property of easy test generation, is s PLA design with added product terms and/or outputs such that tests are easy to generate, even no effort on test generation and fault simulation is necessary. This paper attempts to further clarify the concept of ETG circuits and extends the concepts of pseudo-nonconcurrency and separation to reduce the hardware overhead, based on a unified singlefault model. Experimental results show that the hardware overhead is generally less than 5%, which is considered to be the lowest cost for testable PLA designs.

关键词： programmable logic array (PLA) test generation easy test generation PLA nonconcurrent P LA design for testability.

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Test Equipment Selection and Deployment of Materiel System Based on Grey Situation Decision

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Journal of Electronic Science and Technology of China 2009年第4期7卷 331-335页

作者： Xi-Xiang Chen Jing Qiu Guan-Jun Liu Yong Zhang College of Mechatronical Engineering and Automation National University of Defense Technology Changsha 410073 China

The situation is constructed when the tests are considered as events and the spare test equipments are considered as strategies. The model of grey situation decision for the test equipment selection and deployment （TESD） is founded. Through analyzing each decision objectives, their relative weights are calculated via analytic hierarchy process （AHP）. The grey situation effect matrix under each objective is computed so that the comprehensive effect measure matrix can be obtained when all of the objectives are traded off by their weights. Finally, the decision-maker can select the optimal situations by the value of the measures and such situations form the overall concept for TESD. The paper combines the AHP with grey situation decision to select and deploy the test equipments optimally. Our experimental results show that the proposed method is effective and efficient.

关键词： Effect measure grey situation decision test equipment testability.

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