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检索条件"主题词=resist"
43 条 记 录,以下是1-10 订阅
排序:
POLYMETHYLMETHACRYLATE LANGMUIR-BLODGETT FILMS FOR HIGH RESOLUTION ELECTRON BEAM resist
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Journal of Electronics(China) 1994年 第3期11卷 247-252页
作者: 鲁武 顾宁 韦钰 沈浩瀛 张岚 Southeast University Nanjing 210018 Nanjing Electronic Devices Institute Nanjing 210016
Ultra-thin (20-100nm) polymethylmethacrylate(PMMA) films prepared by Langmuir-Blodgett techniques have been explored as high resolution electron beam resists. A Hitachi S-450 Scanning Electron Microscope (SEM) has bee... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Investigation on resist development rate model for synchrotron radiation X-ray lithography
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Chinese Science Bulletin 1995年 第10期40卷 861-864页
作者: 谢常青 陈梦真 王玉玲 孙宝银 周生辉 朱樟震 Microelectron R & D Centre Chinese Academy of Sciences Beijing 100010 China Institute of High Energy Physics Chinese Academy of Sciences Beijing 100039 China
Since the synchrotron radiation X-ray lithography (SRXRL) was put forward, it hascaught many people’s attention day after day. It has much benefit, such as high-structuralresolution, large process window, high throug... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
ENERGY DEPOSITION AND DISTRIBUTION WITHIN resist FILM IN ELECTRON BEAM LITHOGRAPHY
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Chinese Science Bulletin 1986年 第15期31卷 1023-1029页
作者: 宋传杰 裘培勇 何延才 Laboratory of Electron Beam Shandong Engineering Institute Ji'nan Shanghai Institute of Ceramics Academia Sinica.INTRODUCTION Electron beam lithography (EBL)is one of the most important methods to fabricate a submicron VLSI device. The ultimate resolution of EBL is limited by electron scattering in resist film and substrate (Fig. 1). E-beam irradiation changes
*** Electron beam lithography (EBL)is one of the most important methods to fabricate a submicron VLSI device. The ultimate resolution of EBL is limited by electron scattering in resist film and substrate (Fig. 1). E-b... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
bell hooks: To resist Misrepresentations of the Outlaw Culture
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海外英语 2012年 第4X期 3-5页
作者: 黄春燕 北京物资学院外语系 北京101149
The thesis summarizes bell hooks' stand and viewpoints as expressed in her book Outlaw Culture:resisting *** this collection,hooks argues that the outlaw culture,a culture of the marginalized groups including black pe... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
resistANCE OF THE DEUTERATED YEAST TO THE RADIATION OF FAST NEUTRONS
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Chinese Science Bulletin 1984年 第2期29卷 253-255页
作者: 要福增 吴元芳 张留芳 李惠源 周迪时 舒荣生 Shanghai Institute of Nuclear Research Academia Sinica Shanghai Beer plant Shanghai Institute of Materia Medies Academia Sinica
The relative biological effect of the fast neutron is far greater than 1, thus a neutron bomb can kill the living beings through its strong neutron radiation. Theoretically, if the protium composition is substituted b... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Some Observations on the Position and Role of The Chinese People's War of resistance against Japanese Aggression in World War Ⅱ
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Peace 2015年 第3期 15-19页
作者: Hu Dekun The Chinese Research Association of History of the Second World War
*** is the first country to resist the fascist aggression in the world,and opens up the world’s first anti-fascist *** fascist forces waged World WarⅡ.Those fascists exercised cruel and autocratic rule internally,an... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Association of adiponectin,free fatty acids,and insulin resistance with metabolic syndrome and its components in Uygur Xinjiang
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China Medical Abstracts(Internal Medicine) 2014年 第2期31卷 88-89页
作者: 闫贻忠 Dept Public Health Med CollShihezi Univ
Objective To investigate the association of adiponectin(APN),free fatty acids(FFA),and insulin resistance(IR)with metabolic syndrome(MS)and its *** In the baseline survey,the subjects were divided into MS group and th... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
A process study of electron beam nano-lithography and deep etching with an ICP system
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Science China(Technological Sciences) 2009年 第6期52卷 1665-1671页
作者: LI QunQing ZHANG LiHui CHEN Mo FAN ShouShan Department of Physics and Tsinghua-Foxconn Nanotechnology Research Center Tsinghua UniversityBeijing 100084China
A systemic process study on an electron beam nanolithography system operating at 100kV was *** exposure conditions were optimized for resist *** structures with line/space of 50nm/50nm were obtained in a reasonably th... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Shrinkage Properties of Wool and Acrylic/Wool Plain Knitted Fabrics Treated with DC109
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Journal of China Textile University(English Edition) 1999年 第2期16卷 61-67页
作者: Au K.F Ng K.Y The Hong Kong Polytechnic Univ Hong Kong Hong Kong
This paper examines the effects of shrink - resist treatment, washing cycle and fabric tightness on the shrinkage properties of plain knitted fabrics made from 100% wool, acrylic/wool (50/50) and acrylic/wool (70/30).... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Quick screening and easy detection method of NDM-gene in clinical isolates:A need of the time
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Asian Pacific Journal of Tropical Medicine 2012年 第10期5卷 839-840页
作者: Asad U Khan Saeedut Z Ali Interdisciplinary Biotechnology Unit Aligarh Muslim University
The emerging trend of multidrug resistance is becoming a major threat to community acquired and nosocomial infections,worldwide[1].The carbapenems are used as last-source drugs because of increasing resistance against... 详细信息
来源: 维普期刊数据库 维普期刊数据库 评论