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检索条件"主题词=register allocation"
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Timing Error Aware register allocation in TS
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Computer Systems Science & Engineering 2022年 第1期40卷 273-286页
作者: Sheng Xiao Jing He Xi Yang Heng Zhou Yujie Yuan Information Science and Engineering Department Hunan First Normal UniversityChangsha410205China Computer School Wuhan UniversityWuhan430072China Department of Computer Science Kennesaw State UniversityKennesaw30144-5588USA Hunan Guangyi Experimental Middle School Changsha410205China
Timing speculative(TS)architecture is promising for improving the energy efficiency of microprocessors.Error recovery units,designed for tolerating occasional timing errors,have been used to support a wider range of v... 详细信息
来源: 维普期刊数据库 维普期刊数据库 评论
register allocation Algorithm for High-Level Circuit Synthesis for Improved Testability
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Tsinghua Science and Technology 2008年 第6期13卷 836-842页
作者: 成本茂 王红 杨士元 牛道恒 靳洋 Department of Automation Tsinghua University Qingdao Branch Naval Aeronautical Engineering Academy
register allocation in high-level circuit synthesis is important not only for reducing area, delay, and power overheads, but also for improving the testability of the synthesized circuits. This paper presents an impro... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Improving on Linear Scan register allocation
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International Journal of Automation and computing 2018年 第2期15卷 228-238页
作者: Shahrzad Kananizadeh Kirill Kononenko Department of Computer Science Saarland University Saarbrticken Germany Ecole Normale Superieure/French Institute for Research in Computer Science and Automation (INRIA) Paris France
register allocation is a major step for all compilers. Various register allocation algorithms have been developed over the dec- ades. This work describes a new class of rapid register allocation algorithms and present... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
A Novel register allocation Algorithm for Testability
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Tsinghua Science and Technology 2007年 第S1期12卷 57-60页
作者: 孙强 周涛 李海军 Department of Computer Science and Technology Harbin Engineering University Department of Mathematics Shaanxi University of Technology
In the course of high-level synthesis of integrate circuit, the hard-to-test structure caused by irrational schedule and allocation reduces the testability of circuit. In order to improve the circuit testability, this... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论