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Accurate Calculation of process capability indices Considering the Skewed Distribution

Advances in Manufacturing 2000年第S1期4卷 130-133页

作者： SHEN Xue-jin, ZHU Li-jin, CHEN Xiao-yang School of Electromechanical Engineering and Automation, Shanghai University, Shanghai 200072, China School of Electromechanical Engineering and Automation Shanghai University Shanghai 200072 China

Two simple, easy and correct process capability indices are presented in this paper which is based on the investigation of the actual management situation of manufacture process in the medium or small enterprise of our country, and the applicability analysis for the evaluating methods of process capability. The coincidental degree of distribution center between the product quality and the spec tolerance is considered in the method, and the parameter of actual standard deviation is used. So the indices have higher accuracy and reflect the essential aspect of the problem.

关键词： process capability process capability indices evaluating method

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Two processes Comparison by Using capability indices C_(pm)

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厦门大学学报（自然科学版） 2002年第S1期41卷 188-189页

作者： K S Chen Jann-Pygn Chen T W Chen Department of Industrial Engineering & Management National Chin -Yi Institute of TechnologyDepartment of Industrial Engineering & ManagementNational Chin -Yi Institute of TechnologyDepartment of Mechanical Engineering National Chin-Yi Institute of Technology Taiwan China

In recent years, there has been mounting interest i n measuring process performance in manufacturing industry. Based on analyzing the process capability indices, a production department can trace and improve a poor process to enhance quality levels and satisfy customers. The process capabilit y analysis can also serve as an important reference for making decisions for imp roving the global quality of all products. Since C p and C pk are failed to account for process centering, the index C pm is developed. The index C pm takes the process centering into consideration and is su itable for the processes with nominal-the-best type. There are other indices l ike C pu and C pl, and those indices are used for unilateral s pecification processes. Chou (1994) developed a procedure using estimators of C p, C pu and C pl for practitioners to determine whether two p rocesses are equal capability or not. For bilateral specifications processes, i ndex C p is failed to measure process yield and process centering. Thus, th e index C pm is used to develop a similar procedure for practitioners t o determine whether two processes are equal capability or not. The decisions mad e using the procedure to select the better supplier are, of course, more reliabl e.

关键词： process capability indices test statistic proce ss yield process centering

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Two processes Comparison by Using capability indices Cpm

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厦门大学学报(自然科学版) 2002年第S1期 188-189页

作者： K S Chen,Jann-Pygn Chen,T W Chen Department of Industrial Engineering & Management National Chin -Yi Institute of Technology Department of Industrial Engineering & Management National Chin -Yi Institute of Technology Department of Mechanical Engineering National Chin-Yi Institute of Technology Taiwan China

关键词： process capability indices test statistic proce ss yield process centering

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Integrated process capability Analysis

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厦门大学学报（自然科学版） 2002年第S1期41卷 193-页

作者： Chen H T Huang M L Hung Y H Chen K S Department of Industrial Engineering and Management Hsing Kuo UniversityDepartment of Industrial Engineering and Management National Chin-Yi Institute of TechnologyDepartment of Industrial Engineering and Management National Chin-Yi Institute of TechnologyDepartment of Industrial Engineering and Management National Chin-Yi Institute of Technology TaiwanChinaTaiwanChinaTaiwanChina TaiwanChina

process capability Analysis (PCA) is a powerful too l to assess the ability of a process for manufacturing product that meets specific ations. The larger process capability index implies the higher process yield, a nd the larger process capability index also indicates the lower process expected loss. Chen et al. (2001) has applied indices C pu, C pl, and C pk for evaluating the process capability for a multi-process product wi th smaller-the-better, larger-the-better, and nominal-the-best specificati ons respectively. However, C pk cannot reasonably reflect the process expected loss. In this paper, index C pn is selected to replace C pk. indices C pu, C pl, and C pn are used to evalu ate the entire process capability for a multi-process product with smaller-the -better, larger-the-better, and nominal-the-best specifications respectivel y. An integrated process capability index for a multi-process product is propo sed. The relationship between process capability index and the process yield is introduced. A multi-process capability analysis chart (MPCAC), reasonably rev ealing the status of process capability for the entire product, is constructed f or practical application. An evaluating procedure of the process capability for the entire product is also provided.

关键词： process capability indices integrated capability analysis process yield

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