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Position-resolved Surface Characterization and Nanofabrication Using an optical microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force microscope

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Nano-Micro Letters 2014年第1期6卷 70-79页

作者： Sangmin An Baekman Sung Haneol Noh Corey Stambaugh Soyoung Kwon Kunyoung Lee Bongsu Kim Qhwan Kim Wonho Jhe Center for Nano-Liquid Department of Physics and AstronomySeoul National University National Institute of Standards and Technology

In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope(OM) combined with a nanopipette-based quartz tuning fork atomic force microscope(nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions. Solutions consisting of 5 nm Au nanoparticles, nanowires, and polydimethylsiloxane(PDMS) are deposited onto the substrate through the nano/microaperture of a pulled pipette. Nano/microscale patterning is performed using a nanopipette/QTF-AFM, while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization(force spectroscopy/microscopy) using the quartz tuning fork(QTF) sensor. Nanofabrication is achieved by accurately positioning target materials on the surface, and on-demand delivery and patterning of various solutions for molecular architecture.

关键词： Surface characterization Nanopipette QTF-AFM optical microscope

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Comparative Alpha Tracks Counting Using an optical microscope and a Spark Counter

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Detection 2023年第2期10卷 7-18页

作者： Dabo S. I. Agba Ponaho Kezo Issa Konaté Laboratory of Fundamental and Applied Physics University Nangui Abrogoua Abidjan Cote d’Ivoire Laboratory of Environmental Science and Technology University Jean Lorougnon Guede Daloa Cote d’Ivoire Nuclear Physics and Radiation Protection Team Laboratory of Matter Sciences Environment and Solar Energy University Félix Houphou&#235t Boigny Abidjan Cote d’Ivoire

In the metrology of radon, an environmental lung carcinogen, the integrated measurements necessary for epidemiological studies are made very often using the tracks detector LR 115 type 2. For dosimetric analysis, the etched tracks from radon alpha particles on this detector are usually counted by means of an optical microscope or a spark counter. An optimal reading of the track densities which must be converted into radon concentrations, can’t be done without a good mastery of the mode of operation and use of these devices. Furthermore, investigations to know as to whether or not each of those can be used to determine radon concentration are necessary. These are the objectives of the present work in which LR 115 samples exposed to radon for at least 3 months, were chemically developed under standard conditions and read. The track densities obtained with the microscope are very much higher than those of the counter for each sample. These results are consistent with those published by other authors. However, each of these devices can be used interchangeably for alpha tracks counting, as both provide radon concentrations with a very good linear correlation coefficient of 0.95 taking into account their respective calibration factors for the reading of this detector. In addition, the saturation phenomenon for the spark counter reading of LR 115 detector occurs beyond 11,000 tr/cm2, a density never reached during our environmental radon measurements.

关键词： LR 115 Detector optical microscope Spark Counter Alpha Track Density Calibration Factor Radon Concentration

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Microstructure Investigation on Refractories Under optical microscopes

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China's Refractories 2013年第1期22卷 32-37页

作者： LI Yushan HAN Bo ANH(Tianjin) Refractories Co. Ltd.

optical microscopes with polishing equipment possess high performance/cost ratio for refractories industry. Here, the preparation of polishing sections of refractory materials and products and their observation under microscopes were introduced in detail. The observation of microstructures helps to improve and optimize production process. optical microscopes can observe （1） homogenous or inhomogeneous composition distribution to improve mixing intensity; （2） coarse grains contact or not and contacted grain edges broken or intact to adjust the pressing parameters to avoid overpressure ; （ 3 ） the filling degree of components to optimize the particle size distribution; （4） the sintering necks and bridges and matrix shrinkage status to adjust sintering intensity or sintering atmosphere; （5） the crack edge in round or sharp to know when the cracks formed （ before or after entering sintering zone） and take countermeasures ; （6） used refractories to find the wear mechanism.

关键词： microstructures optical microscope refractories magnesia

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A Comparative Study of Human and Animal Hairs:Microscopic Hair Comparison and Cytochrome c Oxidase I Species Identification

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Journal of Forensic Science and Medicine 2019年第1期5卷 20-23页

作者： Venusia Cortellini Anna Carobbio Gloria Brescia Nicoletta Cerri Andrea Verzeletti Department of Medical and Surgical Specialties Radiological Sciences and Public HealthForensic Medicine UnitUniversity of BresciaBresciaItaly

Human and animal hairs have been used in forensic investigations for over a *** is stable under adverse natural conditions;hence,it is often recovered at the crime scene,and it is necessary to determine whether the hair is of human or animal *** and genetic characteristics are useful to differentiate human hair from animal *** the present study,we analyzed the distinguishing characteristics of hair of various *** addition,we explore species identification by cytochrome c oxidase I mitochondrial gene *** confirm that both the microscopic and molecular analyses of hairs are useful in forensic investigations.

关键词： Cytochrome c oxidase I hair optical microscope species identification

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Investigation of microscopic characterization of defects in SI-GaAs

Investigation of microscopic characterization of defects in ...

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第14届全国晶体生长与材料学术会议

作者： ZhaoYanqiao, Liu Caichi, Hao Qiuyan and Sun Weizhong (Institute of Information Function Materials, Hebei University of Technology, Tianjin300130, China

Using optical microscope , it is possible to get microscopic characterization of defects in (SI-GaAs)semi-insulating gallium arsenide single crystal. Dislocations and microdefects in 6-inch SI-GaAs we

关键词： SI-GaAs optical microscope defects dislocations microdefects

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