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Comparison of central corneal thickness measurements with three new optical devices and a standard ultrasonic pachymeter

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International Journal of Ophthalmology(English edition) 2014年第2期7卷 302-308页

作者： Hasan Ali Bayhan Seray Aslan Bayhan Iz.zet Can Department of Ophthalmology Bozok University Faculty of Medicine

AIM:To compare the RTVue spectral optical coherence tomography(SD-OCT),Sirius Scheimpflug-Placido topographer,Lenstar optical low coherence reflectometry(OLCR)and ultrasound pachymetry(USP)devices in terms of their agreement and repeatability of measuring central corneal thickness(CCT).METHODS:In this prospective study,50 eyes of 50patients were *** repeated measures were obtained using SD-OCT,Scheimpflug-Placido topographer and USP and five measurements were determined with the ***-Altman plots were used to assess agreement among the instruments,and 95%limits of agreement(LoA)for each comparison were ***-examiner repeatability was assessed using intraclass correlation coefficients(ICCs).RESULTS:The mean CCT by SD-OCT,ScheimpflugPlacido topographer,OLCR,and USP were 525.90±34.08μm,525.92±34.10μm,530.30±35.62μm,and543.50±37.11μm *** 4 modalities of CCT measurements correlated closely with each other,with Pearson correlation coefficients ranging from 0.977 *** mean differences(and upper/lower LoA)for CCT measurements were-0.05±6.77μm(13.3/-13.3)between SD-OCT and Scheimpflug-Placido topographer,4.38±3.79μm(11.8/-3.1)between OLCR and SD-OCT,4.38±6.03μm(16.2/-7.5)between OLCR and ScheimpflugPlacido topographer,13.20±6.46μm(25.9/0.5)between USP and OLCR,17.59±6.76μm(30.8/4.3)between USP and SD-OCT,and 17.58±8.13μm(33.5/1.6)between USP and Scheimpflug-Placido ***-examiner repeatability was excellent for all devices with ICCs>***:For most practical purposes,CCT measurements with the RTVue,Sirius and Lenstar can be used *** highly correlated,CCTmeasurement differences between USP and these 3optical instruments can be significant depending on the clinical situation.

关键词： central corneal thickness optical low coherence reflectometry spectral optical coherence tomography Scheimpflug-Placido topographer

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