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A single-photon fault-detection method for nanocircuits that use GaN material

Science China(Technological Sciences) 2014年第2期57卷 270-277页

作者： PAN ZhongLiang CHEN Ling ZHANG GuangZhao WU PeiHeng School of Physics and Telecommunications Engineering South China Normal University Department of Electronics and Communications Sun Yat-sen University Research Institute of Superconductor Electronics Nanjing University

As the complexity of nanocircuits continues to increase,developing tests for them becomes more *** analysis and the localization of internal test points within nanocircuits are already more difficult than for conventional integrated *** this paper,a new method of testing for faults in nanocircuits is presented that uses single-photon detection to locate failed components(or failed signal lines)by utilizing the infrared photon emission characteristics of *** emitted photons,which can carry information about circuit structure,can aid the understanding of circuit properties and locating *** this paper,in order to enhance the strength of emitted photons from circuit components,test vectors are designed for circuits’components or signal *** test vectors can cause components to produce signal transitions or switching behaviors according to their positions,thereby increasing the strength of the emitted photons.A multiple-valued decision diagram(MDD),in the form of a directed acrylic graph,is used to produce the test *** an MDD corresponding to a circuit is constructed,the test vectors are generated by searching for specific paths in the MDD of that *** results show that many types of faults such as stuck-at faults,bridging faults,crosstalk faults,and others,can be detected with this method.

关键词： nanoscale circuits test approaches single-photon detection test-vector generation multiple-valued decision diagram

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