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Toplayer-dependent crystallographic orientation imaging in the bilayer two-dimensional materials with transverse shear microscopy

引用

Frontiers of physics 2021年第5期16卷 165-172页

作者： Sabir Hussain Rui Xu Kunqi Xu Le Lei Shuya Xing Jianfeng Guo Haoyu Dong Adeel Liaqat Rashid Iqbal Muhammad Ahsan Iqbal Shangzhi Gu Feiyue Cao Yan Jun Li Yasuhiro Sugawara Fei Pang Wei Ji Liming Xie Shanshan Chen Zhihai Cheng Beijing Key Laboratory of Optoelectronic Functional Materials&Micro-nano Devices Department of PhysicsRenmin University of ChinaBeijing100872China CAS Key Laboratory of Standardization and Measurement for Nanotechnology CAS Center for Excellence in NanoscienceNational Center for Nanoscience and TechnologyBeijing100190China Key Laboratory of Inorganic Functional Materials and Devices Shanghai Institute of CeramicsChinese Academy of SciencesShanghai200050China University of Chinese Academy of Sciences Beijing100039China Department of Applied Physics Graduate School of EngineeringOsaka University2-1 YamadaokaSuitaOsaka565-0871Japan

Nanocontact properties of two-dimensional(2D)materials are closely dependent on their unique nanomechanical systems,such as the number of atomic layers and the supporting ***,we report a direct observation of toplayer-dependent crystallographic orientation imaging of 2D materials with the transverse shear microscopy(TSM).Three typical nanomechanical systems,MoS_(2) on the amorphous SiO_(2)/Si,graphene on the amorphous SiO_(2)/Si,and MoS_(2) on the crystallized Al_(2)O_(3),have been investigated in *** experimental observation reveals that puckering behaviour mainly occurs on the top layer of 2D materials,which is attributed to its direct contact adhesion with the AFM ***,the result of crystallographic orientation imaging of MoS_(2)/SiO_(2)/Si and MoS_(2)/Al_(2)O_(3) indicated that the underlying crystalline substrates almost do not contribute to the puckering effect of 2D *** work directly revealed the top layer dependent puckering properties of 2D material,and demonstrate the general applications of TSM in the bilayer 2D systems.

关键词： 2D materials toplayer-dependent crystallographic orientation imaging nanomechanical contact properties transverse shear microscopy

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