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design of Novel and Low Cost Triple-node Upset Self-recoverable latch

原子能科学技术 2023年第12期57卷 2326-2336页

作者： BAI Na MING Tianbo XU Yaohua WANG Yi LI Yunfei LI Li Information Materials and Intelligent Sensing Laboratory of Anhui Province Anhui UniversityHefei 230601China Shanxi Key Laboratory of Advanced Semiconductor Optoelectronic Devices and Integrated Systems Jincheng 048000China Jincheng Research Institute of Opo-mechatronics Industry Jincheng 048000China

With the development of semiconductor technology,the size of transistors continues to *** complex radiation environments in aerospace and other fields,small-sized circuits are more prone to soft error(SE).Currently,single-node upset(SNU),double-node upset(DNU)and triple-node upset(TNU)caused by SE are relatively ***’s solution is not yet fully mature.A novel and low-cost TNU self-recoverable latch(named NLCTNURL)was designed which is resistant to harsh radiation *** analyzing circuit resiliency,a double-exponential current source is used to simulate the flipping behavior of a node’s stored value when an error *** results show that the latch has full TNU self-recovery.A comparative analysis was conducted on seven latches related to ***,a comprehensive index combining delay,power,area and self-recovery—DPAN index was proposed,and all eight types of latches from the perspectives of delay,power,area,and DPAN index were analyzed and *** simulation results show that compared with the latches LCTNURL and TNURL which can also achieve TNU self-recoverable,NLCTNURL is reduced by 68.23%and 57.46%respectively from the perspective of *** the perspective of power,NLCTNURL is reduced by 72.84%and 74.19%,*** the area perspective,NLCTNURL is reduced by about 28.57%and 53.13%,*** the DPAN index perspective,NLCTNURL is reduced by about 93.12%and 97.31%.The simulation results show that the delay and power stability of the circuit are very high no matter in different temperatures or operating voltages.

关键词： circuit reliability latch design self-recoverability soft error radiation hardening triple-node upset

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