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Enhanced electrical properties in bilayered ferroelectric thin films

Science China(Physics,Mechanics & Astronomy) 2013年第3期56卷 551-555页

作者： ZHANG Hao LONG WeiJie CHEN YaQing GUO DongJie Institute of Bio-inspired Structure and Surface Engineering Nanjing University of Aeronautics and Astronautics Institute of NanoScience Nanjing University of Aeronautics and Astronautics

Sr2Bi4Ti5O18(SBTi) single layered and Sr2Bi4Ti5O18 /Pb(Zr0.53Ti0.47)O3(SBTi/PZT) bilayered thin films have been prepared on Pt/TiO2/SiO2/Si substrates by pulsed-laser deposition(PLD).The related structural characterizations and electrical properties have been comparatively investigated.X-ray diffraction reveals that both films have crystallized into perovskite phases and scanning electron microscopy shows the sharp *** films show well-saturated ferroelectric hysteresis loops,however,compared with the single layered SBTi films,the SBTi/PZT bilayered films have significantly increased remnant polarization(Pr) and decreased coercive field(Ec),with the applied field of 260 kV/*** measured Pr and Ec of SBTi and SBTi/PZT films were 7.9 C/cm 2,88.1 kV/cm and 13.0 C/cm 2,51.2 kV/cm,*** addition,both films showed good fatigue-free characteristics,the switchable polarization decreased by 9% and 11% of the initial values after 2.2 10 9 switching cycles for the SBTi single layered films and the SBTi/PZT bilayered films,*** results may provide some guidelines for further optimization of multilayered ferroelectric thin films.

关键词： bilayered films X-ray diffraction scanning electron microscopy ferroelectric properties

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