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Design and verification of the HxI collimator on the ASO-S mission

Research in Astronomy and Astrophysics 2021年第6期21卷 241-252页

作者： Deng-Yi Chen Yi-Ming Hu Tao Ma Yang Su Jian-Feng Yang Jian-Ping Wang Guang-Zhou xu xian-Kai Jiang Jian-Hua Guo Yong-Qiang Zhang Yan Zhang Wei Chen Jin Chang Zhe Zhang Key Laboratory of Dark Matter and Space Astronomy Purple Mountain ObservatoryChinese Academy of SciencesNanjing 210023China University of Science and Technology of China Hefei 230026China xi’an Institute of Optics and Precision Mechanics Chinese Academy of SciencesXi’an 710119China Innovation Academy for Microsatellites of Chinese Academy of Sciences Shanghai 201210China

A space-borne hard x-ray collimator,comprising 91 pairs of grids,has been developed for the Hard x-ray Imager(HxI).The HxI is one of the three scientific instruments onboard the first Chinese solar mission:the Advanced Space-based Solar Observatory(ASO-S).The HxI collimator(HxI-C)is a spatial modulation x-ray telescope designed to observe hard x-rays emitted by energetic electrons in solar *** paper presents the detailed design of the HxI-C for the qualification model that will be inherited by the flight *** tests on the HxI-C qualification model are reported to verify the ability of the HxI-C to survive the launch and to operate normally in on-orbit ***,results of the x-ray beam test for the HxI-C are presented to indirectly identify the working performance of the HxI-C.

关键词： Solar observation ASO-S x-ray telescope the collimator verification

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Investigation of natural contamination layer growth on optical substrates

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Chinese Physics C 2018年第11期42卷 107-119页

作者： Li Jiang Qiu-Shi Huang Igor V.Kozhevnikov Yi-Yun Yao Jiang-Tao Feng Yu-Fei Feng Bin Ma Hong-Fei Jiao Hong Chen Zhong Zhang Zhan-Shan Wang Key Laboratory of Advanced Micro-Structured Materials MOE Institute of Precision Optical Engineering School of Physics Science and Engineering Tongji University Shanghai 200092 China Shubnikov Institute of Crystallography of Federal Scientific Research Centre "Crystallography and Photonics" of the Russian Academy of Sciences Leninskiy pr. 59 Moscow 119333 Russia

The surface contamination layer on mirrors can cause significant degradation of the optical performance, which is widely observed in applications, particularly in the fabrication of x-ray focusing telescopes. In this paper, we study the natural contamination layer arising from adsorption precipitation of hydrocarbons or other organic and water molecules in the absence of any external factor. Temporal evolution of the layer formed on super-smooth fused silica, borosilicate glass, and silicon substrates is studied by x-ray reflectometry, atomic force microscopy, and transmission electron microscopy for a one-year period after surface cleaning. The general characteristics of adhesion layer growth are established and discussed. The reconstructed dielectric constant profiles demonstrate that an increase in the adhesion layer thickness, deposited mass and density over time obeys power laws with extremely small exponents. Therefore, the adhesion layer growth is rapid immediately after surface cleaning, with a - 1 nm thick layer formed within the first day on all three substrates studied, while the layer density is low （- 1 g/cm^3）. The layer growth on the fused silica and silicon substrates became very slow in the succeeding days, with only a 1.4-1.5 nm thick layer and 1.2-1.3 g/cm^3 density after one year of storage in air. At the same time, the adhesion layer growth on the glass substrate showed unexpected acceleration about two months after cleaning, so that the layer thickness reached - 2.2 nm after one year of storage. The reason for this effect, which is connected with leaching of the glass, is discussed briefly.

关键词： x-ray telescope surface contamination surface dynamics x-ray reflectometry inverse problem

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