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characterization and degradation of β-Sn particles in thermal aged Pb-rich solder joint for low-temperature co-fired ceramic(LTCC) applications

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Rare Metals 2024年第10期43卷 5346-5361页

作者： Jin-Hong Liu Zhe Zhu Qiang-Qiang Nie Jun-Fu Liu Peng He Shu-Ye Zhang State Key Laboratory of Advanced Welding and Joining Harbin Institute of Technology Anhui Key Laboratory of Microsystem East China Research Institute of Microelectronics School of Materials Science and Engineering Hefei University of Technology

High-lead solder joints are still playing an indispensable role in military and space ***, in-depth characterization of high-lead solder joints and the underlying degradation mechanisms remain unexplored. This research first performed aging tests on Sn10Pb90 solder joints, the shear strength at room and elevated temperatures gradually reduced, and the resistance increased. Here, a two-layered Ni–Sn intermetallic compound(IMC) structure was identified using transmission electron microscopy(tem), which could be attributed to the change of Sn content in the solder. Moreover, the internal annealing twin of a Sn particle was discovered,which could be attributed to creeping induced by thermal expansion coefficient(CTE) difference between Sn and *** analysis of partial and whole annealing twins was conducted through high-resolution tem(HRtem).Finally, four degradation mechanisms were *** of the IMC layer would result in increased brittleness and resistivity. For particle coarsening, apart from diminishing the ductility and toughness of the solder joint, it would also accelerate the creeping rate by weakening the phase boundary strength. Regarding voids and cracks induced by phase boundary sliding, wedgeshaped cracking and pore-shaped cracking were discovered and their formation was analyzed. Most importantly, the consumption of Sn resulted in a depletion of wettable layer,leading to the formation of Pb streams and isolated IMC islands, also known as the spalling and delamination of IMCs. Pb diffusion followed a spiral path, which was mutually influenced by orientation misfit and concentration gradient. A technique to prevent cracking was *** research is expected to provide significant technical references for high-lead solder joints.

关键词： Aging Degradation mechanisms High-lead solder joints Properties tem characterization

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Advanced Transmission Electron Microscopy for Identification of Atomic-Scale Configurations of Zeolite-Supported Metal Catalysts

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Chinese Journal of Chemistry 2022年第19期40卷 2371-2373页

作者： Xuan Tang Jiajie Ye Yun Guo Sheng Dai Key Laboratory for Advanced Materials and Feringa Nobel Prize Scientist Joint Research Center Frontiers Science Center for Materiobiology and Dynamic ChemistryEast China University of Science and TechnologyShanghai200237 China Key Laboratory for Advanced Materials Research Institute of Industrial CatalysisSchool of Chemistry and Molecular EngineeringEast China University of Science and Technology130 Meilong RoadShanghai200237 China

Zeolite-supported metal catalysts have important applications in various catalytic reactions,but unveiling their atomic-scale structures is always a grand *** developed transmission electron microscopy(tem)characterization techniques,e.g.,integrated differential-phase contrast(iDPC)scanning transmission electron microscopy(Stem)is emerging as a powerful tool for visualizing the electron beam-sensitive materials at atomic resolution,thus,providing new opportunities for imaging the exact configurations of metal species in the various channels of *** emerging topic summarizes recent progress utilizing iDPC-Stem-related technique for determination of the structures of metal species in zeolites that should offer insights into the structure-property relationships of zeolite-supported metal catalysts.A brief perspective about the new tem technique is also presented,showing prospects in this field that will stimulate further scientific research in zeolite-supported metal catalysts.

关键词： Metal-zeolite Catalyst structure Heterogeneous catalysis tem characterization Electron microscopy

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