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cellular automata basedmulti-bit stuck-at fault diagnosis for resistive memory

Frontiers of Information Technology & Electronic Engineering 2022年第7期23卷 1110-1126页

作者： Sutapa SARKAR Biplab Kumar SIKDAR Mousumi SAHA Department of Electronics and Communication Engineering Seacom Engineering CollegeHowrahWest Bengal 711302India Department of Computer Science and Technology Indian Institute of Engineering Science and TechnologyHowrahWest Bengal 711103India Department of Computer Science and Engineering National Institute of TechnologyDurgapurWest Bengal 713209India

This paper presents a group-based dynamic stuck-at fault diagnosis scheme intended for resistive randomaccess memory(ReRAM).Traditional static random-access memory,dynamic random-access memory,NAND,and NOR flash memory are limited by their scalability,power,package density,and so ***-generation memory types like ReRAMs are considered to have various advantages such as high package density,non-volatility,scalability,and low power consumption,but cell reliability has been a *** memory operation is caused by permanent stuck-at faults due to extensive use of write-or memory-intensive *** increased number of stuck-at faults also prematurely limit chip ***,a cellular automaton(CA)based dynamic stuck-at fault-tolerant design is proposed here to combat unreliable cell functioning and variable cell lifetime issues.A scalable,block-level fault diagnosis and recovery scheme is introduced to ensure readable data despite multi-bit stuck-at *** scheme is a novel approach because its goal is to remove all the restrictions on the number and nature of stuck-at faults in general fault *** proposed scheme is based on Wolfram’s null boundary and periodic boundary CA *** special classes of CAs are introduced for 100%fault tolerance:single-lengthcycle single-attractor cellular automata(SACAs),single-length-cycle two-attractor cellular automata(TACAs),and single-length-cycle multiple-attractor cellular automata(MACAs).The target micro-architectural unit is designed with optimal space overhead.

关键词： Resistive memory Cell reliability Stuck-at fault diagnosis single-length-cycle single-attractor cellular automata single-length-cycle two-attractor cellular automata single-length-cycle multiple-attractor cellular automata

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