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Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data

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National Science Review 2019年第1期6卷 55-63页

作者： Boyuan Huang Ehsan Nasr Esfahani Jiangyu Li Department of Mechanical Engineering University of Washington Shenzhen Key Laboratory of Nanobiomechanics Shenzhen Institutes of Advanced TechnologyChinese Academy of Sciences

Ever-increasing hardware capabilities and computation powers have enabled acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turn out to be redundant,noisy and/or irrelevant to the problems of interest, and it remains nontrivial to draw clear mechanistic insights from pure data analytics. In this work, we use scanning probe microscopy(SPM) as an example to demonstrate deep data methodology for nanosciences, transitioning from brute-force analytics such as data mining, correlation analysis and unsupervised classification to informed and/or targeted causative data analytics built on sound physical understanding. Three key ingredients of such deep data analytics are presented. A sequential excitation scanning probe microscopy(SE-SPM) technique is first developed to acquire high-quality, efficient and physically relevant data, which can be easily implemented on any standard atomic force microscope(AFM). Brute-force physical analysis is then carried out using a simple harmonic oscillator(SHO) model, enabling us to derive intrinsic electromechanical coupling of ***, principal component analysis(PCA) is carried out, which not only speeds up the analysis by four orders of magnitude, but also allows a clear physical interpretation of its modes in combination with SHO analysis. A rough piezoelectric material has been probed using such a strategy, enabling us to map its intrinsic electromechanical properties at the nanoscale with high fidelity, where conventional methods *** SE in combination with deep data methodology can be easily adapted for other SPM techniques to probe a wide range of functional phenomena at the nanoscale.

关键词： sequential excitation scanning probe microscopy principal component analysis simple harmonic oscillator model

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Correlating the Interfacial Polar-Phase Structure to the Local Chemistry in Ferroelectric Polymer Nanocomposites by Combined scanning probe microscopy

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Nano-Micro Letters 2023年第1期15卷 80-93页

作者： Jiajie Liang Shaojie Wang Zhen Luo Jing Fu Jun Hu Jinliang He Qi Li State Key Laboratory of Power System Department of Electrical EngineeringTsinghua UniversityBeijing 100084People’s Republic of China

Ferroelectric polymer nanocomposites possess exceptional electric properties with respect to the two otherwise uniform phases,which is commonly attributed to the critical role of the matrix-particle interfacial ***,the structure-property correlation of the interface remains unestablished,and thus,the design of ferroelectric polymer nanocompos-ite has largely relied on the trial-and-error ***,a strategy that combines multi-mode scanning probe microscopy-based electrical charac-terization and nano-infrared spectroscopy is developed to unveil the local structure-property correlation of the interface in ferroelectric polymer *** results show that the type of surface modifiers decorated on the nanoparticles can significantly influence the local polar-phase content and the piezoelectric effect of the polymer matrix surrounding the *** strongly coupled polar-phase content and piezoelectric effect measured directly in the interfacial region as well as the computed bonding energy suggest that the property enhancement originates from the formation of hydrogen bond between the surface modifiers and the ferroelectric *** is also directly detected that the local domain size of the ferroelectric polymer can impact the energy level and distribution of charge traps in the interfacial region and eventually influence the local dielectric strength.

关键词： Interfaces Ferroelectric polymers Nanocomposites scanning probe microscopy Nano-infrared spectroscopy

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Combination of Instrumented Nanoindentation and scanning probe microscopy for Adequate Mechanical Surface Testing

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Journal of Materials Science & Technology 2009年第1期25卷 63-68页

作者： Enrico Tam Mikhail Petrzhik Dmitry Shtansky Marie-Paule Delplancke-Ogletree Université Libre de Bruxelles Moscow State Institute of Steel and Alloys

The elastic indentation modulus and hardness of standard bulk materials and advanced thin films were determined by using the nanoindentation technique followed by the Oliver- Pharr post-treatment. After measurements with different loading/unloading schemes on chemically polished bulk titanium a substantial decrease of both modulus and hardness vs an increasing loading time was found. Then, hard nanostructured TiBN and TiCrBN thin films deposited by magnetron sputtering （using multiphase targets） on substrates of high roughness （sintered hard metal） and low roughness （silicon） were studied. Experimental modulus and hardness characterized by using two different nanoindenter tools were within the limits of standard deviation. However, a strong effect of roughness on the spread of the experimental values was observed and it was found that hardness and elastic indentation modulus obeyed a Gaussian distribution. The experimental data were discussed together with scanning probe microscopy （SPM） images of typical imprints taken after the nanoindentation tests and the local topographyls strong correlation with the results of nanoindentation was described.

关键词： Nanoindentation Thin films Coatings scanning probe microscopy

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A Comprehensive FIB Lift-out Sample Preparation Method for scanning probe microscopy

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Nanomanufacturing and Metrology 2022年第1期5卷 67-79页

作者： F.Ji Y.Yao T.Xin J.Seidel School of Materials Science and Engineering UNSW SydneySydneyNSW 2052Australia ARC Centre of Excellence in Future Low-Energy Electronics Technologies(FLEET) UNSW SydneySydneyNSW 2052Australia Electron microscopy Unit(EMU) Mark Wainwright Analytical CentreUNSW SydneySydneyNSW 2052Australia

In this work,we investigate cross-sectional sample preparation for atomic force microscopy and general scanning probe microscopy(SPM)*** light of traditional cross-sectional sample preparation solutions for transmission electron microscopy,mechanical polishing and focused ion beam(FIB)milling have been employed to prepare cross-sectional samples for *** present an optimized solution for thin films and oxide heterostructures that allows for examining the prepared surfaces using various SPM *** particular,post-cleaning after FIB milling is shown to be crucial and precision ion polishing was conducted to remove rough layers on mechanically polished *** also study SPM mechanical milling to remove amorphous layers on FIB-milled ***,a reliable solution for making cross sections suitable for SPM has been achieved providing a useful methodology that can also be employed for other material systems with different hardness,such as polymers and metals.

关键词： Oxide heterostructures Cross-sectional measurements scanning probe microscopy AFM FIB

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scanning probe microscopy in probing low-dimensional carbon-based nanostructures and nanomaterials

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Materials Futures 2022年第3期1卷 84-104页

作者： Chi Zhang Zewei Yi Wei Xu Interdisciplinary Materials Research Center College of Materials Science and EngineeringTongji UniversityShanghai 201804People’s Republic of China

Carbon,as an indispensable chemical element on Earth,has diverse covalent bonding ability,which enables construction of extensive pivotal carbon-based structures in multiple scientific *** extraordinary physicochemical properties presented by pioneering synthetic carbon allotropes,typically including fullerenes,carbon nanotubes,and graphene,have stimulated broad interest in fabrication of carbon-based nanostructures and *** regulation of topology,size,and shape,as well as controllably embedding target sp^(n)-hybridized carbons in molecular skeletons,is significant for tailoring their structures and consequent properties and requires atomic precision in their *** probe microscopy(SPM),combined with on-surface synthesis strategy,has demonstrated its capabilities in fabrication of various carbon-based nanostructures and nanomaterials with atomic precision,which has long been elusive for conventional solution-phase synthesis due to realistic obstacles in solubility,isolation,purification,*** intriguingly,atom manipulation via an SPM tip allows unique access to local production of highly reactive carbon-based *** addition,SPM provides topographic information of carbon-based nanostructures as well as their characteristic electronic structures with unprecedented submolecular resolution in real *** this review,we overview recent exciting progress in the delicate application of SPM in probing low-dimensional carbon-based nanostructures and nanomaterials,which will open an avenue for the exploration and development of elusive and undiscovered carbon-based nanomaterials.

关键词： scanning probe microscopy carbon nanostructures carbon nanomaterials synthetic carbon allotropes on-surface synthesis

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Surface Properties of Cement Paste Evaluated by scanning probe microscopy

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Open Journal of Civil Engineering 2016年第4期6卷 643-652页

作者： Yuya Sakai Institute of Industrial Science The University of Tokyo Tokyo Japan

The microscopic physical properties of Hardened Cement Paste (HCP) surfaces were evaluated by using scanning probe microscopy (SPM). The cement pastes were cured under a hydrostatic pressure of 400 MPa and the contacting surfaces with a slide glass during the curing were studied. scanning Electron Microscope (SEM) observation at a magnification of 7000 revealed smooth surfaces with no holes. The surface roughness calculated from the SPM measurement was 4 nm. The surface potential and the frictional force measured by SPM were uniform throughout the measured area 24 h after the curing. However, spots of low surface potential and stains of low frictional force and low viscoelasticity were observed one month after curing. This change was attributed to the carbonation of hydrates.

关键词： Cement Paste scanning probe microscopy Surface Potential Frictional Resistance Viscoelasticity

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Exploring scanning probe microscopy with MATHEMATICA 2nd; completely rev. and enl. ed.

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2007年

作者： Dror Sarid

ISBN: (数字)9783527609871

ISBN: (纸本)9783527610068

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

关键词： scanning probe microscopy

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On-surface synthesis and characterization of polyynic carbon chains

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National Science Review 2024年第3期11卷 192-199页

作者： Wenze Gao Wei Zheng Luye Sun Faming Kang Zheng Zhou Wei Xu Interdisciplinary Materials Research Center School of Materials Science and Engineering Tongji University

Carbyne, an elusive sp-hybridized linear carbon allotrope, has fascinated chemists and physicists for decades. Due to its high chemical reactivity and extreme instability, carbyne was much less explored in contrast to the sp2-hybridized carbon allotropes such as graphene. Herein, we report the on-surface synthesis of polyynic carbon chains by demetallization of organometallic polyynes on the Au（111） surface;the longest one observed consists of ～60 alkyne units（120 carbon atoms）. The polyynic structure of carbon chains with alternating triple and single bonds was unambiguously revealed by bond-resolved atomic force microscopy. Moreover, an atomically precise polyyne, C14, was successfully produced via tip-induced dehalogenation and ring-opening of the decachloroanthracene molecule(C14Cl10) on a bilayer NaCl/Au（111） surface at 4.7 K, and a band gap of 5.8 eV was measured by scanning tunnelling spectroscopy,in a good agreement with the theoretical HOMO–LUMO gap（5.48 eV）.

关键词： polyyne scanning probe microscopy carbon allotrope on-surface synthesis organometallic polyyne

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On-surface photo-induced dechlorination

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Chinese Chemical Letters 2024年第9期35卷 198-201页

作者： Yu He Hao Jiang Shaoxuan Yuan Jiayi Lu Qiang Sun Materials Genome Institute Shanghai UniversityShanghai 200444China

On-surface Ullmann-type reaction,or the dehalogenated coupling,is arguably the most pivotal reaction in on-surface synthesis for the fabrications of carbon ***,the vast majority of works rely on activating the C-Br bond of aryl bromide which has a moderate bond dissociation *** C-Cl bond of aryl chloride has a higher dissociation energy and requires much higher thermal energy to break the *** this study,we have explored the on-surface photo-induced dechlorination and achieved the activation of three distinct aryl chlorines on the Au(111)surface with mild *** work enriches our understanding of on-surface photo-induced reactions and highlights the potential of photochemistry in realizing unconventional reactions.

关键词： On-surface synthesis scanning probe microscopy On-surface photochemistry Dechlorination reaction

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Local probing of the non-uniform distribution of ferrielectric and antiferroelectric phases

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Nano Research 2023年第2期16卷 3021-3027页

作者： Huimin Qiao Fangping Zhuo Zhen Liu Jinxing Wang Jeongdae Seo Chenxi Wang Jinho Kang Bin Yang Yunseok Kim School of Advanced Materials and Engineering Sungkyunkwan University(SKKU)Suwon 16419Republic of Korea Research Center for Advanced Materials Technology Sungkyunkwan University(SKKU)Suwon 16419Republic of Korea Department of Materials and Earth Sciences Technical University of DarmstadtDarmstadt 64287Germany Department of Physics College of ScienceNortheast Forestry UniversityHarbin 150040China Department of Physics Korea Advanced Institute of Science and Technology(KAIST)Daejeon 34141Republic of Korea School of Instrumentation Science and Engineering Harbin Institute of TechnologyHarbin 150080China

Piezoresponse force microscopy(PFM)is an indispensable tool in the investigation of local electromechanical responses and polarization *** acquired data provide spatial information on the local disparity of polarization switching and electromechanical responses,making this technique advantageous over macroscopic *** its widespread application in ferroelectrics,it has rarely been used to investigate the ferrielectric(FiE)behaviors in antiferroelectric(AFE)***,the PFM was utilized to study the local electromechanical behavior and distribution of FiE,and the AFE phases of PbZrO_(3)thin-film were studied,where only the FiE behavior is observable using a macroscopic *** FiE region resembles a ferroelectric material at low voltages but exhibits a unique on-field amplitude response at high *** contrast,the AFE region only yields an observable response at high ***-field simulations reveal the coexistence of AFE and FiE states as well as the phase-transition processes that underpin our experimental *** work illustrates the usefulness of PFM as an analytical tool to characterize AFE/FiE materials and their phase-coexistence behavior,thereby providing insights to guide property modification and potential applications.

关键词： scanning probe microscopy ferrielectrics antiferroelectrics local electromechanical response

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