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检索条件"主题词=Scale formation"
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Review on corrosion and corrosion scale formation upon unlined cast iron pipes in drinking water distribution systems
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Journal of Environmental Sciences 2022年 第7期34卷 173-189页
作者: Haiya Zhang Dibo Liu Lvtong Zhao Jun Wang Shuguang Xie Shuming Liu Pengfei Lin Xiaojian Zhang Chao Chen State Key Joint Laboratory of Environmental Simulation and Pollution Control School of EnvironmentTsinghua UniversityBeijing 100084China State Key Joint Laboratory of Environmental Simulation and Pollution Control College of Environmental Sciences and EngineeringPeking UniversityBeijing 100871China Research Institute for Environmental Innovation(Suzhou) TsinghuaSuzhou 215163China State Key Laboratory of Environmental Criteria and Risk Assessment Chinese Research Academy of Environmental SciencesBeijing 100012China
The qualified finished water from water treatment plants(WTPs) may become discolored and deteriorated during transportation in drinking water distribution systems(DWDSs), which affected tap water quality seriously. Th... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Influence of simulating deep-sea environmental factors on cathodic performance of seawater battery
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Journal of Oceanology and Limnology 2020年 第2期38卷 334-341页
作者: LU Yonghong YANG Lulu ZHANG Yue ZHAO Qing SANG Lin DING Fei XU Haibo College of Chemistry and Chemical Engineering Ocean University of ChinaQingdao 266100China National Key Laboratory of Science and Technology on Power Sources Tianjin Institute of Power SourcesTianjin 300084China
A metal-dissolved oxygen seawater battery(SWB)uses metal and dissolved oxygen as the reactants,and it is ideal for use as a long-time low-power distributed power supply in deep sea,due to its advantages of open struct... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Discussion on the CHE Programming Characteristics with the Scaling Down of Charge Trapping Flash Memory
Discussion on the CHE Programming Characteristics with the S...
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2006 8th International Conference on Solid-State and Integrated Circuit Technology
作者: Lei Sun Liyang Pan Xian Luo Dong Wu Jun Zhu Institute of Microelectronics Tsinghua University
<正>The scaling down issues in the charge trapping memory are investigated in this work.In the sub-100 nm devices,the punch-through problem,as well as high program voltage and electrical field limitation are studied... 详细信息
来源: cnki会议 评论
Instabilities in Deep Submicron SRAM
Instabilities in Deep Submicron SRAM
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2006 8th International Conference on Solid-State and Integrated Circuit Technology
作者: Ashish Kumar Non-Volatile Static Memories Group STMicroelectronics Pvt Ltd NoidaIndia
<正>Scaling to nano scale cmos has provided high density SRAM.Reduced cell area and increased density has created problem of standby leakage.scaled down SRAM cell has more leakage and at high temperature it creates ... 详细信息
来源: cnki会议 评论