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Electric dipolar interaction assisted growth of single crystalline organic thin films

Chinese Physics B 2010年第6期19卷 448-452页

作者：蔡金明张余洋胡昊鲍丽宏潘理达唐卫李果杜世萱沈健高鸿钧 Institute of Physics Chinese Academy of Sciences Materials Sciences and Technology Division Oak Ridge National LaboratoryOak Ridge Materials Sciences and Technology Division Oak Ridge National LaboratoryOak RidgeTennessee 37831USA

We report on a forest-like-to-desert-like pattern evolution in the growth of an organic thin film observed by using an atomic force microscope. We use a modified diffusion limited aggregation model to simulate the growth process and are able to reproduce the experimental patterns. The energy of electric dipole interaction is calculated and determined to be the driving force for the pattern formation and evolution. Based on these results, single crystalline films are obtained by enhancing the electric dipole interaction while limiting effects of other growth parameters.

关键词： electric dipolar interaction organic thin films diffusion limited aggregation model

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Characterization of organic thin films by atomic force microscopy based techniques

Characterization of organic thin films by atomic force micro...

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第18届国际真空大会

作者： A. Pavitschitz G. Hlawacek M. Kratzer A. Lex G. Trimmel H.-G. Flesch T. Potocar T. Griesser R. Resel A. Winkler W. Kern C. Teichert Institute of Physics University of Leoben Institute of Chemistry and Technology of organic Materials Graz University of Technology Institute of Solid State Physics Graz University of Technology Institute of Chemistry of Polymeric Materials University of Leoben

This contribution will be dedicated to the mechanical and electrical characterization of organic thin films by friction force microscopy （FFM）, conductive atomic force microscopy （C-AFM） and transverse shear microscopy （TSM）. Firstly, we report on the investigation of ultrathin layers （self-assembled monolayers （SAMs）） of organic photosensitive molecules, which can be photoisomerized upon illumination with UV light and further modified through a contact mask （equidistant lines and spaces） to achieve photochemically patterned surfaces. We apply ex situ AFM to study the surface morphology of organosilane SAMs by quantitative roughness analysis including analysis of lateral correlation lengths and roughness exponents [1], which allows the evaluation and optimization of different film preparation conditions. FFM is used to distinguish the chemical difference in the patterned surface. Indeed, significant friction contrast between up to four different surface terminations can be observed simultaneously on the same sample [2]. Utilizing the Varenberg method [3], corresponding quantitative friction force measurements are performed to determine the difference of nanotribology in the patterns. Further it will be demonstrated that C-AFM can detect the different electrical properties in the patterns.

关键词： AFM organic thin films FFM C-AFM TSM

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PREPARATION AND CHARACTERIZATION OF organic TfflN FILM OF STEARIC ACID/PYRAZOLINE NANOPARTICLES

PREPARATION AND CHARACTERIZATION OF ORGANIC TfflN FILM OF ST...

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Asia Conference on Nanoscience and Nanotechnology Abstracts Book

作者： YOUNG SOO KANG SUN WHA OH Department of Chemistry Pukyong National UniversityBusan608-737Korea Basic Science Research Institute Pukyong National UniversityBusan608-737Korea

Nanoparticles of 1-pbenyl-3-naphthyl-5-((diniethylamino)phenyl)-2-pyrazoline were prepared using the reprecipitation method. We found that pyrazoline nanoparticles possess a special size dependence in their optical properties. The organic thin films of stearic acid/pyrazoline nanoparticles was prepared by transferring Langmuir m0onolayer of stearic acid/pyrazoline nanoparticle onto the solid substrate. The complex of stearic acid/pyrazoline nanoparticle was studied with pressure-area isotherm at me air/water interface and identified with linearly increasing optical absorbance around 370 nm by increasing the number of deposited layers. The in situ domain structure and molecular orientation of the complex were measured with BAM. The surface morphology of the Langmuir-Blodgett film was observed with AFM. The dispersion of pyrazoline nanoparticle in the film was studied with TEM.

关键词： organic thin films pyrazoline nanoparticles Langmuir monolayer.

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