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Femtosecond laser-induced breakdown of multilayers and gold film

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Chinese Optics Letters 2005年第1期3卷 60-62页

作者：孙海轶徐至展贾天卿李晓溪李成斌冯东海徐世珍葛晓春 Laboratory for High Intensity Optics Shanghai Institute of Optics and Fine Mechanics Chinese Academy of Sciences Shanghai 201800

We report single-shot damage threshold as a function of pulse duration (50-900 fs) for MgF2/ZnS 800-nm omnidirectional-reflection film, interference filter, and gold film. The results indicate that the damage with ultrashort pulse is nonthermal, which is different from that with long pulse. Additionally, the ablation crater depths of 45° high-reflection film and interference filter are presented. A logarithmic relation between the ablation depth and pulse fluence, which is similar to that of transparent materials, is found.

关键词： optical films optical multilayers Pulsed laser applications Ultrashort pulses

Laser induced damage of multi-layer dielectric used in pulse compressor gratings

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Chinese Optics Letters 2005年第3期3卷 181-183页

作者：孔伟金赵元安王涛邵建达范正修 Shanghai Institute of Optics and Fine Mechanics

Laser induced damage threshold (LIDT) of multi-layer dielectric used in pulse compressor gratings (PCG) was investigated. The sample was prepared by e-beam evaporation (EBE). LIDT was detected following ISO standard 11254-1.2. It was found that LIDTs of normal and 51.2° incidence (transverse electric (TE) mode) were 14.14 and 9.31 J/cm2, respectively. A Nomarski microscope was employed to map the damage morphology, and it was found that the damage behavior was pit-concave-plat structure for normal incidence, while it was pit structure for 51.2° incidence with TE mode. The electric field distribution was calculated to illuminate the difference of LIDT between the two incident cases.

关键词： Calculations Dielectric materials Diffraction gratings Electric fields Evaporation Morphology optical multilayers Pitting

Multi-energy four-channel Kirkpatrick–Baez microscope for X-ray imaging diagnostics at the Shenguang-II laser facility

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Chinese Optics Letters 2014年第9期12卷 105-109页

作者：伊圣振穆宝忠王新蒋励朱京涛王占山贺鹏飞方智恒王伟傅思祖 MOE Key Laboratory of Advanced Micro-Structured Materials School of Physics Sciences and Engineering Tongji University School of Aerospace Engineering and Applied Mechanics Tongji University Shanghai Institute of Laser Plasma CAEP

A four-channel Kirkpatrick Baez microscope working at multiple energy bands is developed for multiframe X-ray imaging diagnostics at the Shenguang-II laser facility. The response to the multiple energy bands is realized by coating the double-periodic multilayers on the reflected surfaces of the microscope. Because of the limited size of the microstrips in the X-ray framing camera, the image separation is controlled by the coni- cal angle of the reference cores during microscope assembly. This study describes the optical and multilayer design, assembly, and aligmnent of the developed microscope. The microscope achieves a spatial resolution of 4 5 gin in the laboratory and 10 20 ~tm at Shenguang-II laser facility within a 300 tim field of view. The versatile nature of the developed microscope enables the multiple microscopes currently installed in the laser facility to be replaced with a single, multipurpose microscope.

关键词： Band structure Laser diagnostics multilayers optical multilayers X ray analysis