检索结果-南通市图书馆

High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction

Nano Research 2020年第9期13卷 2460-2468页

作者： Susanna Hammarberg Vilgaile Dagyte Lert Chayanun Megan O.Hill Alexander Wyke Alexander Bjorling Ulf Johansson Sebastian Kalbfleisch Magnus Heurlin Lincoln J.Lauhon Magnus T.Borgstrom Jesper Wallentin Synchrotron Radiation Research and NanoLund Lund UniversityBox 118Lund 22100Sweden Solid State Physics and NanoLund Lund UniversityBox 118Lund 22100Sweden Department of Materials Science and Engineering Northwestern UniversityEvanstonIllinois 60208USA max iv Laboratory Lund UniversityBox 118Lund 22100Sweden

Axially heterostructured nanowires are a promising platform for next generation electronic and optoelectronic *** based on theoretical modeling have predicted more complex strain distributions and increased critical layer thicknesses than in thin films,due to lateral strain relaxation at the surface,but the understanding of the growth and strain distributions in these complex structures is hampered by the lack of high-resolution characterization ***,we demonstrate strain mapping of an axially segmented GalnP-lnP 190 nm diameter nanowire heterostructure using scanning X-ray *** systematically investigate the strain distribution and lattice tilt in three different segment lengths from 45 to 170 nm,obtaining strain maps with about 10^-4 relative strain *** experiments were performed using the 90 nm diameter nanofocus at the Nanomax beamline,taking advantage of the high coherent flux from the first diffraction limited storage ring max *** experimental results are in good agreement with a full simulation of the experiment based on a three-dimensional(3D)finite element *** largest segments show a complex profile,where the lateral strain relaxation at the surface leads to a dome-shaped strain distribution from the mismatched interfaces,and a change from tensile to compressive strain within a single *** lattice tilt maps show a cross-shaped profile with excellent qualitative and quantitative agreement with the *** contrast,the shortest measured InP segment is almost fully adapted to the surrounding GalnP segments.

关键词： strain mapping nanowire heterostructure X-ray diffraction(XRD) max iv finite element modeling

来源：

维普期刊数据库评论

在线全文

维普期刊数据库

学校读者我要写书评

暂无评论

欢迎您,

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

在线全文

请选择保存的检索档案：

请选择收藏分类：

通借通还

欢迎您,

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

在线全文

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：