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Structural Characteristics of Sainan imbricated Thrust System in the North-Fringe Block-Faulting Belt of Qaidam Basin

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International Journal of Mining Science and Technology 1999年第2期20卷 136-139页

作者：张守仁曹代勇戴俊生杨文光

Sainan imbricated thrust system is a kind of typical nappe structure. Using the method of plot excess area, this paper calculates the detachment depth of this thrust system. The calculating result shows that the detachment depth is about 15 km underground and tbe shorteuiug of the strata is much more than 700 m. Analysis of fault growth indexs and seismic reflection profiles reveals that this thrust system is developed by the mixing propagation, from piggyback propagation to overstep propagation.

关键词： sainan imbricated thrust system detachment depth mixing propagation

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Film-Forming Properties of Fullerene Derivatives in Electrospray Deposition Method

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Journal of Surface Engineered Materials and Advanced Technology 2013年第1期3卷 84-88页

作者： Kazumasa Takeshi Kenji Takagi Takeshi Fukuda Teiji Chihara Yusuke Tajima Department of Functional Materials Science Graduate School of Science and Engineering Saitama University Saitama Japan

Thin films of three types of fullerene derivatives were prepared through the electrospray deposition (ESD) method. The optimized conditions for the fabrication of the thin films were investigated for different types of fullerene derivatives: [6,6]-phenyl-C61-butyric acid methyl ester, [6,6]-phenyl-C71-butyric acid methyl ester, and indene-C60-monoadduct. The spray diameter during the ESD process was observed as a function of the supply rate achieved by changing the applied voltage. In all cases, the spray diameter increased with increasing applied voltage, reaching the maximum diameter (Dmax) in the voltage range 4 to 6 kV. It was clear that Dmax was influenced by the dipole moments of the fullerene derivatives (as calculated by density functional theory methods). Scanning electron microscopy observation of the?fabricated thin films showed that imbricated structures were formed through the stacking of the fullerene-derivative sheets. Atomic force microscopy images revealed that the density of the imbricated structure was dependent on the spray diameter during the ESD process, and the root-mean-square roughness of the film surface decreased with increasing applied voltage. These findings suggest that the ESD method will be effective for the preparation of fullerene-derivative thin films for the production of organic devices.

关键词： Electrospray Deposition Method Fullerene Derivative Thin Film Scanning Electron Microscope imbricated Structure Atomic Force Microscope Root-Mean-Square Roughness

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