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Improved Attribute Chain Sampling Plan for darna distribution

Computer Systems Science & Engineering 2021年第9期38卷 381-392页

作者： Harsh Tripathi Amer Ibrahim Al-Omari Mahendra Saha Ayed R.A.Alanzi Department of Statistics Central University of RajasthanRajasthanIndia Department of Mathematics Faculty of ScienceAl al-Bayt UniversityMafraqJordan Department of Mathematics College of Science and Human Studies at HotatSudairMajmaah UniversityMajmaah 11952Saudi Arabia

Recently,the darna distribution has been introduced as a new lifetime *** two-parameter darna distribution represents is a mixture of two well-known gamma and exponential distributions.A manufacturer or an engineer of products conducts life testing to examine whether the quality level of products meets the customer’s requirements,such as reliability or the minimum *** this article,an attribute modified chain sampling inspection plan based on the time truncated life test is proposed for items whose lifetime follows the darna *** plan parameters,including the sample size,the acceptance number,and the past lot result of the proposed sampling plan,are determined with the help of the two-point approach considering the acceptable quality level(AQL)and the limiting quality level(LQL).The plan parameters and the corresponding operating characteristic functions of a new plan are provided in tabular form for various darna distribution ***,a few illustrated examples are presented for various distribution *** usefulness of the proposed attribute modified chain sampling plan is investigated using two real failure time *** results indicate that the proposed sampling plan can reduce the sample size when the termination ratio increases for fixed values of the producer’s risk and acceptance ***,the proposed attribute modified chain sampling inspection plan is recommended to practitioners in the field.

关键词： Attribute chain sampling inspection plan consumer’s risk darna distribution operating characteristic curve producer’s risk truncated life test

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