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检索条件"主题词=Confocal Raman"
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A non-destructive channel stress characterization for gate-allaround nanosheet transistors by confocal raman methodology
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National Science Open 2023年 第2期2卷 37-45页
作者: Ziqiang Huang Tao Liu Jingwen Yang Xin Sun Kun Chen Dawei Wang Hailong Hu Min Xu Chen Wang Saisheng Xu David Wei Zhang School of Microelectronics Fudan UniversityShanghai 200433China Shanghai Integrated Circuit Manufacturing Innovation Center Company Ltd. Shanghai 200433China Zhangjiang Fudan International Innovation Center Shanghai 200433China WITec(Beijing)Scientific Technology Co. Ltd.Beijing 100027China
Non-destructive stress characterization is essential for gate-all-around(GAA)nanosheet(NS)transistors technology,while it is a big challenge to be realized on nanometer-sized GAA devices by using traditional Micro-Ram... 详细信息
来源: 维普期刊数据库 维普期刊数据库 同方期刊数据库 同方期刊数据库 评论
Deliquescence and Efflorescence Processes of Aerosol Particles Studied by in situ FTIR and raman Spectroscopy
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Chinese Journal of Chemical Physics 2008年 第1期21卷 1-11页
作者: Li-jun Zhao Feng Wang Kun Zhang Qing-xuan Zeng Yun-hong Zhang The Institute of Chemical Physics School of Science Beijing Institute of Technology Beijing 100081China School of Aerospace Science and Engineering Beiy'ing Institute of Technology Beijing 100081 China
Deliquescence and efflorescence are the two most important physicochemical processes of aerosol particles. In deliquescence and efflorescence cycles of aerosol particles, many fundamental problems need to be investiga... 详细信息
来源: 维普期刊数据库 维普期刊数据库 评论