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A novel colloid probe preparation method based on chemical etching technique

Journal of Zhejiang University-Science B(Biomedicine & Biotechnology) 2006年第4期7卷 304-309页

作者： XU Hui XU Guo-hua AN Yue Department of Chemical Engineering Zheflang University Hangzhou 310027 China

Several fundamental problems in hydrophobic force measurements using atomic force microscope (AFM) are dis-cussed in this paper. A novel method for colloid probe preparation based on chemical etching technology is proposed, which is specially fit for the unique demands of hydrophobic force measurements by AFM. The features of three different approaches for determining spring constants of rectangular cantilevers, including geometric dimension, Cleveland and Sader methods are com-pared. The influences of the sizes of the colloids on the measurements of the hydrophobic force curves are investigated. Our experimental results showed that by selecting colloid probe with proper spring constant and tip size, the hydrophobic force and the complete hydrophobic interaction force curve can be measured by using AFM.

关键词： Hydrophobic force Atomic force microscope (AFM) colloid probe Chemical etching

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Interfacial forces between silica surfaces measured by atomic force microscopy

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Journal of Environmental Sciences 2009年第1期21卷 30-34页

作者： DUAN JinmingKey Laboratory of Northwest Water Resource,Environment and Ecology,MOE,Xi’an University of Architecture and Technology,Xi’an 710055,China Key Laboratory of Northwest Water Resource Environment and Ecology MOE Xi'an University of Architecture and Technology Xi'an 710055 China

colloidal particle stability and some other interfacial phenomena are governed by interfacial force interactions. The two well known forces are van der Waals force and electrostatic force, as documented by the classical Derjaguin, Landau, Verwey, and Overbeek （DLVO） theory. Moreover, advances in modern instrumentation and colloid science suggested that some short-ranged forces or structure forces are important for relevant colloidal systems. The interfacial and/or molecular forces can be measured as a resultant force as function of separation distance by atomic force microscopy （AFM） colloid probe. This article presents a discussion on AFM colloid probe measurement of silica particle and silica wafer surfaces in solutions with some technical notifications in measurement and data convolution mechanisms. The measured forces are then analyzed and discussed based on the ＇constant charge＇ and ＇constant potential＇ models of DLVO theory. The difference between the prediction of DLVO theory and the measured results indicates that there is a strong short-range structure force between the two hydrophilic surfaces, even at extremely low ionic concentration, such as Milli-Q water purity solution.

关键词： colloid probe DLVO theory solvation forces interfacial interactions

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