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Evaluation of growth characteristics of Aspergillus parasiticus inoculated in different culture media by shortwave infrared(SWIR) hyperspectral imaging

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Journal of Innovative Optical Health Sciences 2018年第5期11卷 69-83页

作者： Xuan Chu Wei Wang Xinzhi Ni Haitao Zheng Xin Zhao Hong Zhuang Kurt C.Lawrence Chunyang Li Yufeng Li Chengjun Lu College of Engineering China Agricultural University Beijing 100083P.R.China College of Mechanical and Electrical Engineering Zhongkai University of Agriculture Engineering Guangzhou 510225 P.R.China Crop Genetics and Breeding Research Unit USDA-ARS 2747 Davis RoadTiftonGA 31793USA College of Food Science&Nutritional Engineering China Agricultural University Beijing 100083PR.China Quality&Safety Assessment Research Unit U.S.National Poultry Research Center USDA-ARS 950 College Station Rd.AthensGA 30605USA Quality&Safety Assessment Research Unit USDA-ARS AthensGA 30605USA Institute of Food Science and Technology Jiangsu Academy of Agricultural Sciences Nanjing 210014 P.R.China Multidisciplinary Initiative Center Institute of High Energy Physics Chinese Academy of Sciences Beijing 100049 P.R.China Lingang Experimental Middle School Linyi 276624 P.R.China

The growth characteristics of Aspergillus parasitic us incubated on two culture media were ex-amined using shortwave infrared(SWIR,1000-2500 nm)hyperspectral imaging(HSI)in this *** images of the *** colonies growing on rose bengal medium(RBM)and maize agar medium(MAM)were recorded daily for 6 *** growth phases of *** were indicated through the pixel number and average spectra of *** score plot of the first principal component(PC1)and PC2,four growth zones with varying mycelium densities were *** characteristic wavelengths(1095,1145,1195,1279,1442,1655,1834 and 1929 nm)were selected from PC1 loading,average spectra of each colony as well as each growth zone.F urthermore,support vector machine(S VM)classifier based on the eight wavelengths was built,and the classification accuracies for the four zones(from outer to inner zones)on the colonies on RBM were 99.77%,9935%,99.75%and 99.60%and 99.77%,9939%,99.31%and 98.22%for colonies on *** addition,a new score plot of PC2 and PC3 was used to differ-entiate the colonies incubated on RBM and MAM for 6 *** characteristic wavelengths of 1067,1195,1279,1369,1459,1694,1834 and 1929 nm were selected from the loading of PC2 and *** on them,a new SVM model was developed to diferentiate colonies on RBM and MAM with accuracy of 100.00%and 9999%,*** conclusion,SWIR hyperspectral image is a powerful tool for evaluation of growth characteristics of *** incubated in diferent culture media.

关键词： aspergilus parasiticus growth characteristics characteristic wavelengths shortwave infrared(SWIR)hyperspectral imaging

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