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Application of IWO-SVM Approach in Fault Diagnosis of analog circuits

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Application of IWO-SVM Approach in Fault Diagnosis of Analog...

第25届中国控制与决策会议

作者： Shuxiang Cai Haiwen Yuan Jianxun Lv Yong Cui School of Automation Science and Electrical Engineering Beihang University

ISBN: (纸本)9781467355339

Support vector machine （SVM） is a machine learning algorithm which has been applied to fault diagnosis of analog circuits. Invasive weed optimization （IWO） is a novel numerical optimization algorithm inspired from weed colonization. An approach that combines IWO and SVM （IWO-SVM） is proposed to fault diagnosis of analog circuits in this paper. The process of fault diagnosis of analog circuits using IWO-SVM approach is introduced in details. A biquadrate filter is used to test the performance of IWO-SVM approach for fault diagnosis. The simulation experiments show that the IWO-SVM approach proposed in this paper has a higher diagnosis accuracy rate than the conventional SVM in fault diagnosis of analog circuits.

关键词： Fault Diagnosis SVM IWO IWO-SVM analog circuits

Diagnosis of soft faults in analog integrated circuits based on fractional correlation

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Journal of Semiconductors 2012年第8期33卷 117-122页

作者：邓勇师奕兵张伟 School of Automation Engineering University of Electronic Science and Technology of China School of Electronics and Information Engineering Southwest Petroleum University

Aiming at the problem of diagnosing soft faults in analog integrated circuits, an approach based on fractional correlation is proposed. First, the Volterra series of the circuit under test （CUT） decomposed by the fractional wavelet packet are used to calculate the fractional correlation functions. Then, the calculated fractional correlation functions are used to form the fault signatures of the CUT. By comparing the fault signatures, the different soft faulty conditions of the CUT are identified and the faults are located. Simulations of benchmark circuits illustrate the proposed method and validate its effectiveness in diagnosing soft faults in analog integrated circuits.

关键词： analog circuits soft faults fault diagnosis Volterra series fractional correlation

Fault Diagnosis of analog circuits with Tolerances Using Artificial Neural Networks

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Fault Diagnosis of Analog Circuits with Tolerances Using Art...

Electronic Communication Systems--The 2000 IEEE Asia-Pacific Conference on circuits and Systems

作者： Ying Deng Yigang He Yichuang Sun College of Electrical and Information Engineering Hunan University

ISBN: (纸本)0780362535

＜正＞This paper proposes a method for analog fault diagnosis using neural *** primary focus of the paper is to provide robust diagnosis using a mechanism to deal with the problem of component tolerances and reduce testing *** proposed approach is based on the k-fault diagnosis method and artificial backward propagation neural *** results show that the method is robust and fast for fault diagnosis of analog circuits with tolerances.

关键词： analogue circuits fault diagnosis circuit testing neural nets circuit analysis computing analog circuits component tolerances ANN analog fault diagnosis robust diagnosis testing time reduction k-fault diagnosis method artificial backward propagation neural network

On the Application of Artificial Neural Networks to Fault Diagnosis in analog circuits with Tolerances

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On the Application of Artificial Neural Networks to Fault Di...

2000年第16届世界计算机大会

作者： Deng Ying He Yigang College of Electrical and Information Engineering Hunan University

＜正＞This paper proposes a method for analog fault diagnosis by adopting neural networks. The primary focus of the paper is to provide robust diagnosis using a mechanism to deal with the problem of component tolerances and reduce testing *** proposed approach is based on the k-fault diagnosis method and artificial backward propagation neural network,which is shown to be capable of robust diagnosis of analog circuits with tolerances.

关键词： Artificial neural networks analog circuits Fault diagnosis Tolerances

Multiple Fault Diagnosis of analog Circuit Using Quantum Hopfield Neural Network

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Multiple Fault Diagnosis of Analog Circuit Using Quantum Hop...

第25届中国控制与决策会议

作者： Penghua Li Yi Chai Ming Cen Yifeng Qiu Ke Zhang College of Automation Chongqing University of Posts and Telecommunications State Key Laboratory of Power Transmission Equipment & System Security and New Technology College of Automation Chongqing University

ISBN: (纸本)9781467355339

This paper address the multiple fault problem of analog circuit using quantum Hopfield neural network. The proposed quantum neural model, from the evolution of quantum states, gives a new interpretation of the associative memory mechanism in term of probability. The fault features are obtained by the wavelet packet analysis and energy calculation. The quantized ideal features of single fault and the actual features of multiple fault are regarded as quantum ground states and quantum excited states in the quantum space, respectively. Any excited state （multiple fault） in this space can be described as a superposition state of each quantum ground state with different probability amplitudes. The occurrence of this probability amplitude can be obtained by comparing the measurement matrix of the quantum-key-input mode with the measurement matrix of the quantum memory prototype. The numerical experiments offer a good explanation of the appearing probability of multiple faults.

关键词： Multiple Fault Diagnosis Quantum Hopfield Neural Network Occurred Probability analog circuits

Evolutionary Topology Programming for analog Circuit Fault Tolerant Design

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Evolutionary Topology Programming for Analog Circuit Fault T...

第25届中国控制与决策会议

作者： Mei Xue Jingsong He Department of Electronic Science and Technology University of Science and Technology of China

ISBN: (纸本)9781467355339

In this paper, an evolutionary programming strategy based on netlist-based encoding is proposed. During the evolutionary process, mutation operators directly operate the connecting points. Besides that, we introduce the knowledge of graph theory into measuring the richness of circuit topological structure. Experimental results show that the proposed method is beneficial to generate circuits with various topologies .The experimental results of fault-tolerant tests based on structural failure model show that the richness of circuit topological structure is helpful to improving the fault-tolerant capability of analog circuits.

关键词： Design automation rich topology fault tolerant analog circuits

A Vague Decision Method for analog Circuit Fault Diagnosis Based on Description Sphere

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Chinese Journal of Aeronautics 2011年第6期24卷 768-776页

作者： LUO Hui WANG Youren CUI Jiang College of A utomation Engineering Nanjing University of A eronauties and Astronautics Nanjing 210016 China

This paper proposes a vague decision method for analog circuit fault diagnosis based on description sphere. Firstly, the proposed method uses the wavelet transform as the preprocessor to extract fault features from the output voltages of the circuit un- der test （CUT）. And then, each class sample is trained to produce a minimum description sphere. Finally, the test samples are detected by a defined vague decision rule, which is based on the vague weight distance between the test data and the center of description sphere. The defined decision rule fuses the truth and false membership degrees of the test sample and the weight of the description sphere, and it can effectively deal with the uncertain information. The reliability of the defined decision rule is proved theoretically. This new diagnostic method is first applied to testing two actual circuits, and then it is compared with other two diagnostic methods. The experimental results show that the proposed technique can achieve good performance and reduce the diagnostic time.

关键词： analog circuits fault detection description sphere vague set multi-class classification

A Numerical Method for Modeling the Effects of Irregular Shape on Interconnect Resistance

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Chinese Physics Letters 2014年第5期31卷 126-129页

作者：陈宝君唐祯安鞠艳杰 School of Electronics and Information Engineering Dalian Jiaotong University Dalian 116028 School of Electronic Science and Technology Dalian University of Technology Dalian 116023

When clock frequencies exceed gigahertz, the skin depth in analog and digital circuits greatly decreases. The irregular shape of the cross section of the interconnect plays an increasingly important role in interconnect parasitic extraction. However, existing methods only focus on the rough surface of the interconnect, while ignoring other irregular shapes, such as the trapezoidal cross section. In this work, a new simulation method is proposed for irregular interconnects, which is applicable to arbitrary irregular shapes and to a wide range of frequencies. The method involves generating a mesh information file firstly, and then extracting the frequency-dependent resistance based on a numerical solution of scalar wave modeling by using the method of moments. The singularity extraction method is used to calculate the self-inductors. The data from experiments verify the accuracy of our proposed method.

关键词： DIGITAL electronics analog circuits INTERCONNECTS (Integrated circuit technology) METALS -- Pickling MOMENTS method (Statistics)

Canonic Realizations of Voltage-Controlled Floating Inductors Using CFOAs and analog Multipliers

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circuits and Systems 2016年第11期7卷 3617-3625页

作者： Raj Senani Data Ram Bhaskar Munish Prasad Tripathi Manoj Kumar Jain Division of Electronics and Communication Engineering Netaji Subhas Institute of Technology New Delhi India Department of Electronics and Communication Engineering Faculty of Engineering and Technology Jamia Millia Islamia New Delhi India Department of Electrical Engineering Delhi Technological University New Delhi India Department of Electronics and Communication Engineering National Institute of Technology Ashok Rajpath Bihar India Department of Electronics Engineering Institute of Engineering and Technology Lucknow India

New voltage-controlled floating inductors employing CFOAs and an analog multiplier have been presented which have the attractive features of using a canonic number of passive components (only two resistors and a capacitor) and not requiring any component-matching conditions and design constraints for the intended type of inductance realization. The workability and applications of the new circuits have been demonstrated by SPICE simulation and hardware experimental results based upon AD844-type CFOAs and AD633-type/MPY534 type analog multipliers.

关键词： Voltage Controlled Inductors Floating Inductors Inductance Simulation Current Feedback Op-Amps analog Multipliers analog circuits