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CSEE Journal of Power and Energy Systems 2023年第3期9卷 1139-1150页

作者： Ning Yan Xiangjun Li Shaohua Ma Haichuan Zhao Bo Zhang College of Electrical Engineering Shenyang University of TechnologyShenyang 110870China China Electric Power Research Institute Beijing 100192China

Retired power battery construction energy storage systems(ESSs)for echelon utilization can not only extend the remaining capacity value of the battery,and decrease environmental pollution,but also reduce the initial cost of energy storage *** this paper,an ESS constructed of retired power batteries for echelon utilization in microgrids(MGs)is ***,considering the influence of different discharge depths on the battery life cycle,the correlation equation between the state of charge(SOC)and the state of health(SOH)is ***,the accelerated life test method,based on the inverse power law coefficient equation,is proposed,and it is used to evaluate the reliability of the ***,according to the SOC characteristics,the dynamic security margin of the ESS is *** life cycle cost,supply-demand balance and ESS balanced control are comprehensively considered,and the location and capacity of energy storage in MGs are *** is simulated using the IEEE-RTS 24 node system;the results show that the investment cost of the ESS is reduced and the operational life is prolonged.

关键词： ESS echelon utilization accelerated life test balanced control capacity configuration

Design of accelerated life test Plans——Overview and Prospect

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Chinese Journal of Mechanical Engineering 2018年第1期31卷 19-33页

作者： Wen-Hua Chen Liang Gao Jun Pan Ping Qian Qing-Chuan He Key Laboratory of Reliability Technology for Mechanical and Electrical Product of Zhejiang Province Zhejiang Sci-Tech University College of Mechanical and Electrical Engineering Sichuan Agricultural University

accelerated life test(ALT) is currently the main method of assessing product reliability rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess the product reliability accurately, quickly, and economically. With the promotion of the national strategy of civil-military integration, ALT will be widely used in the research and development(R&D) of various types of products, and the ALT plan design theory will face further challenges. To aid engineers in selecting appropriate theories and to stimulate researchers to develop the theories required in engineering, with focus on the demands for theory research that arise from the implementation of ALT, this paper reviews and summarizes the development of ALT plan design theory. The development of the theory and method for planning optimal ALT for location-scale distribution, which is the most applied and mature theory of designing the optimal ALT plan, are described in detail. Taking this as the center of radiation, some problems that ALT now faces, such as the verification of the statistical model, limitation of sample size, solutions of resource limits, optimization of the test arrangement, and management of product complexity, are discussed, and the general ideas and methods of solving these problems are analyzed. Suggestions for selecting appropriate ALT plan design theories are proposed, and the urgent solved theory problems and opinions of their solutions are proposed. Based on the principle of convenience for engineers to select appropriate methods according to the problems found in practice, this paper reviews the development of optimal ALT plan design theory by taking the engineering problems arising from the ALT implementation as the main thread, provides guidelines on selecting appropriate theories for engineers, and proposes opinions about the urgent solved theory problems for researchers.

关键词： accelerated life test test plan Optimal design Reliability assessment

accelerated life test STUDIES OF NEW COATED DISPENSER CATHODES

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Journal of Electronics(China) 2007年第5期24卷 717-720页

作者： Zhang Mingchen Zhang Honglai Liu Pukun Su Xiaobao Li Yutao Institute of Electronics Chinese Academy of Sciences Beijing 100080 China

The life of impregnated Ba-W cathodes with a new construction have been evaluated using an accelerated life test at three different temperatures (1170℃,1130℃,1090℃) and constant current density (2A/cm^2).According to the relationship of life with operating temperatures,an accelerated equation has been set *** cathode life at normal operating temperature is deducted based on the accelerated *** results show that life of the novel cathode exceeds 190,000 hour at a current density of 2A/cm^2.

关键词： Dispenser cathodes accelerated life test

Optimal Design of Multiple Stress Constant accelerated life test Plan on Non-rectangle test Region

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Chinese Journal of Mechanical Engineering 2012年第6期25卷 1231-1237页

作者： CHEN Wenhua GAO Liang LIU Juan QIAN Ping PAN Jun Department of Mechanical Engineering Zhejiang University Hangzhou 310027 China Zhejiang Province's Key Laboratory for Reliability Technology of Mechanical & Electrical Products Zhejiang Sci-Tech University Hangzhou 310018 China

For optimal design of constant stress accelerated life test（CSALT） with two-stress, if the stresses could not reach the highest levels simultaneously, the test region becomes non-rectangular. For optimal CSALT design on non-rectangle test region, the present method is only focused on non-rectangle test region with simple boundary, and the optimization algorithm is based on experience which can not ensure to obtain the optimal plan. In this paper, considering the linear-extreme value model and the optimization goal to minimize the variance of lifetime estimate under normal stress, the optimal design method of two-stress type-I censored CSALT plan on general non-rectangular test region is proposed. First, two properties of optimal test plans are proved and the relationship of all the optimal test plans is determined analytically. Then, on the basis of the two properties, the optimal problem is simplified and the optimal design method of two-stress CSALT plan on general non-rectangular test region is proposed. Finally, a numerical example is used to illustrate the feasibility and effectiveness of the method, The result shows that the proposed method could obtain the optimal test plan on non-rectangular test regions with arbitrary boundaries. This research provides the theory and method for two-stress optimal CSALT planning on non-rectangular test regions.

关键词： accelerated life test non- rectangular test region test plan optimal design

Estimation for constant-stress accelerated life test from generalized half-normal distribution

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Journal of Systems Engineering and Electronics 2017年第4期28卷 810-816页

作者： Liang Wang Yimin Shi School of Mathematics and Statistics Xidian University Department of Applied Mathematics Northwestern Polytechnical University

In the constant-stress accelerated life test, estimation issues are discussed for a generalized half-normal distribution under a log-linear life-stress model. The maximum likelihood estimates with the corresponding fixed point type iterative algorithm for unknown parameters are presented, and the least square estimates of the parameters are also proposed. Meanwhile, confidence intervals of model parameters are constructed by using the asymptotic theory and bootstrap technique. Numerical illustration is given to investigate the performance of our methods.

关键词： accelerated life test maximum likelihood estimation least square method bootstrap technique asymptotic distribution

Constant-step stress accelerated life test of VFD under Weibull distribution case

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Journal of Zhejiang University-Science A(Applied Physics & Engineering) 2005年第7期6卷 722-727页

作者：张建平耿新民 Department of Information & Electronic Engineering Zhejiang University Faculty of Computer and Information Engineering Shanghai University of Electric Power

Constant-step stress accelerated life test of Vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying Weibull distribution for describing the life, and Least Square Method (LSM)for estimating Weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows Weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life.

关键词： Vacuum Fluorescent Display accelerated life test Constant-step Weibull Average life

Constant-Step Stress accelerated life test of VFD under Logarithmic Normal Distribution Case

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Journal of Shanghai Jiaotong university(Science) 2006年第1期11卷 14-17页

作者：张建平谢秀中赵科仁 School of Computer and Information Eng. Shanghai Univ. of Electric PowerShanghai 200090China Zhejiang BOE Display Technology Co.Ltd Shaoxing 312000

In order to solve the life problem of vacuum fluorescent display (VFD) within shorter time, and reduce the life prediction cost, a constant-step stress accelerated life test was performed with its cathode temperature increased. Statistical analysis was done by applying logarithmic normal distribution for describing the life, and least square method (LSM) for estimating logarithmic normal parameters. Self-designed special software was used to predict the VFD life. It is verified by numerical results that the VFD life follows logarithmic normal distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. The accurate calculation of the key parameters enables the rapid estimation of VFD life.

关键词： vacuum fluorescent display accelerated life test logarithmic normal distribution

Analysis and Optimum Plan for 3-Step Step-Stress accelerated life tests with Lomax Model Under Progressive Type-I Censoring

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Communications in Mathematics and Statistics 2018年第1期6卷 73-90页

作者： N.Chandra Mashroor Ahmad Khan Department of Statistics Pondicherry UniversityPuducherryIndia

Inthispaper,theoptimumtestplanandparameterestimationfor3-stepstep-stress accelerated life tests in the presence of modified progressive Type-I censoring are *** is assumed that the lifetime of test units follows a Lomax distribution with log of characteristic life being quadratic function of stress *** maximum likelihood and Bayesian method are used to obtain the point and interval estimators of the model *** Bayes estimates are obtained using Markov chain Monte Carlo simulation based on Gibbs *** optimum plan for 3-step step-stress test under modified progressive Type-I censoring is developed which minimizes the asymptotic variance of the maximum likelihood estimators of log of scale parameter at design ***,the numerical study with sensitivity analysis is presented to illustrate the proposed study.

关键词： accelerated life test Lomax distribution Maximum likelihood estimation Bayesian estimation Progressive Type-I censoring

Designing Adaptive Multiple Dependent State Sampling Plan for accelerated life tests

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Computer Systems Science & Engineering 2023年第8期46卷 1631-1651页

作者： Pramote Charongrattanasakul Wimonmas Bamrungsetthapong Poom Kumam Division of Mathematics Department of Mathematics and Computer ScienceFaculty of Science and TechnologyRajamangala University of Technology KrungthepBangkok10120Thailand Division of Applied Statistics Department of Mathematics and Computer ScienceFaculty of Science and TechnologyRajamangala University of Technology ThanyaburiPathum Thani12110Thailand Center of Excellence in Theoretical and Computational Science(TaCS-CoE)&KMUTT Fixed Point Research Laboratory Room SCL 802 Fixed Point LaboratoryScience Laboratory BuildingDepartments of MathematicsFaculty of ScienceKing Mongkut’s University of Technology Thonburi(KMUTT)Bangkok10140Thailand

A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)*** accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is *** economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s *** results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are *** indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated *** AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling *** real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.

关键词： accelerated life test acceleration factor adaptive of multiple dependent state sampling plan average sample number total cost of inspection weibull distribution

Novel Accelerating life test Method and Its Application by Combining Constan Stress and Progressive Stress

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Chinese Journal of Mechanical Engineering 2018年第5期31卷 17-24页

作者： Wen-Hua Chen Fan Yang Ping Qian Jun Pan Qing-Chuan He Zhejiang Province's Key Laboratory of Reliability Technology for Mechanical and Electronic Product Zhejiang Sci-Tech University School of Engineering Huzhou University

Constant stress accelerated life tests(ALTs) can be applied to obtain a high estimation accuracy of reliability measure?ments, but these are time?consuming tests. Progressive stress ALTs can yield failures more quickly but cannot guaran tee the estimation accuracy of reliability measurements. In this paper, a progressive?constant combination stress ALT is proposed to combine the merits of both tests. The optimal plan, in which the design variables are the initial pro?gressive stress level, the progressive stress ramp rate, the sample allocation proportion of the progressive stress and the constant stress level, is determined using the principle of minimizing the asymptotic variance of the maximum likelihood estimator of the natural log reliable life for the connectors. A comparison between the optimal PCCSALT plan and the CSALT plan with the same sample size and estimation accuracy shows that the test time is reduced by 13.59% by applying the PCCSALT.

关键词： Constant stress Progressive stress accelerated life test Optimal test plan Reliability test