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Aspheric surface measurement based on sub-aperture stitching interferometry

Chinese Optics Letters 2013年第14期11卷 59-62页

作者：王孝坤 Key Laboratory of Optical System Advanced Manufacturing Technology Changchun Institute of Optics Fine Mechanics and Physics Chinese Academy of Sciences Changchun 130033 China

In order to test convex aspheric surfaces without the aid of other null optics, a novel method combined sub-aperture stitching and interferometry called SSI （sub-aperture stitching interferometry） is introduced. In this letter, the theory, basic principle, and flow chart of SSI are researched. A synthetical optimization stitching mode and an effective stitching algorithm are established based on homogeneous coordinate＇s transformation and simultaneous least-squares fitting. The software of SSI is devised, and the prototype for testing of large aspheres by SSI is designed and developed. The experiment is carried out with five sub- apertures for a convex silicon carbide （SIC） aspheric mirror with a clear aperture of 130 ram. The peak-to- valley （PV） and root-mean-square （RMS） error are 0.186 λand 0.019 λ, respectively. For the comparison and validation, the TMA system which contained the convex asphere is tested by interferometry. The wavefront error of the central field of the optical system is 0.068 λRMS which approaches to diffraction limitation. The results conclude that this technique is feasible and accurate. It enables the non-null testing of aspheric surfaces especially for convex aspheres.

关键词： 120.6650 Surface measurements, figure 120.0120 Instrumentation, measurement, and metrology 240.0240 Optics at surfaces

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Measurement of mild asphere by digital plane

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Chinese Optics Letters 2014年第A02期12卷 40-43页

作者：王孝坤 Key Laboratory of Optical System Advanced Manufacturing Technology Changchun Institute of Optics Fine Mechanics and Physics Chinese Academy of Sciences Changchun 130033 China

In order to test mild aspheric surface directly without other null optics, the digital plane method is proposed. When departure of the tested aspheric surface is mild, a sphere mirror can be used as the reference surface. The phase distribution can be measured swiftly by the digital interferometer. The surface error can be obtained by subtracting the theory wavefront error （the value of the digital plane） from the phase data and eliminating the translation errors through least-squares fitting. The basic principle and theory of this method are analyzed and researched, and the testing model and flow chart are established. Meanwhile the experiment is carried out with a mild aspheric mirror by this method, the PV and RMS of the surface error are 0.173λ and 0.018λ （λ is 632.8 nm）, respectively. We also design and make a null corrector to the asphere for contrast, the differences in PV and RMS error between them are 0.026λ and 0.001λ, respectively.

关键词： 120.6650 Surface measurements, figure 120.0120 Instrumentation, measurement, and metrology 240.0240 Optics at surfaces

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Testing of a large rectangular mirror based on sub-aperture stitching method

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Chinese Optics Letters 2015年第13期13卷 40-43页

作者：王孝坤 Key Laboratory of Optica.l System Advanced Manmufacturing Technology Changchun Institute of Optics Fine Mechanics and Physics Chinese Academy of Sciences. Changchun 130033 China

In order to solve tile difficulty of testing large mirror, the sub-aperture stitching interfhrometry （SSI） is proposed and expatiated. Tile basic theory and principle of this method are introduced and analyzed. A reasonable stitching algorithm *** mathematical model are established based on least-squares fitting, triangulation algorithm, homogeneous coordinate transformation, etc., and the relative program and flow chart are established. Some marked points are used to accomplish the alignments between sub-apertures and calibrate the relationship between the coordinate of the mirror and the pixeh With engineering examples, a large rectangular mirror with an irregular aperture of 720×165 （mm） is tested by SSI. The peak-to-valley and root mean square of the stitched surface error are 0.451 λ and 0.042 ）λ （λ is 632.8 nm）, respectively.

关键词： 120.6650 Surface measurements, figure 120.0120 Instrumentation, measurement, and metrology 240.0240 Optics at surfaces

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Active noise thin-plate spline smoothing method for full-field strain measurement by digital image correlation

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Chinese Optics Letters 2012年第B06期10卷 114-116页

作者：赵加清曾攀雷丽萍杜泓飞何文斌 Key Laboratory for Advanced Materials Processing Technology of MOE Department of Mechanical Engineering Tsinghua University Beijing 100084 China

Digital image correlation has become an important and effective non-contact optical full-field strain mea- surement technique. The strain field obtained directly by image correlation algorithm is full of noise. In this letter, we explore a novel way of actively adding small amount of Gaussian random noise to original displacement field, subsequently utilizing the well-known thin-plate spline smoothing （TPSS） technique to smooth the noised displacement field, and finally differentiating smoothed displacement field to get reliable strain field. The resultant method, named as active noise thin-plate spline smoothing （ANTPSS）, outperforms the conventional TPSS and spline least-squares approximation. Moreover, ANTPSS success- fully smooths the displacement filed obtained from three-point bending experiment of foam block and generates a reliable inhomogeneous strain field.

关键词： 120.6650 Surface measurements, figure 100.2000 Digital image processing 110.6150 Speckle imaging

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