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Stable dielectric response of low-loss aromatic polythiourea thin films on Pt/SiO_(2) substrate

Journal of Advanced Dielectrics 2016年第1期6卷 46-49页

作者： A.Eršte L.Fulanović L.Čoga M.Lin Y.Thakur Q.M.Zhang v.bobnar Jožef Stefan Institute Jamova cesta 39 SI-1000 LjubljanaSlovenia Faculty of Mathematics and Physics University of Ljubljana Jadranska ulica 19SI-1000 LjubljanaSlovenia Department of Electrical Engineering and Materials Research Institute The Pennsylvania State University University ParkPennsylvania 16802USA

We have investigated dielectric properties of aromatic polythiourea(ArPTU,a polar polymer containing high dipolar moments with very low defect levels)thin films that were developed on Pt/SiO_(2) *** detected response is compared to the response of commercially available polymers,such as high density polyethylene(HDPE)and polypropylene(PP),which are at present used in foil *** values of the dielectric constantε'≈5(being twice higher than in HDPE and PP)over broad temperature and frequency ranges and dielectric losses as low as in commercial systems suggest ArPTU as a promising candidate for future use in a variety of applications.

关键词： Aromatic polythiourea dielectric polymer film capacitor dielectric spectroscopy ellipsometry

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Stable dielectric response in lead-free relaxor K_(0.5)Na_(0.5)NbO_(3)-SrTiO_(3) thin films

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Journal of Advanced Dielectrics 2014年第2期4卷 41-45页

作者： A.Eršte A.Kupec B.Kmet B.Malič v.bobnar Condensed Matter Physics Department Jozef Stefan Institute Jamova cesta 39SI-1000 LjubljanaSlovenia Electronic Ceramics Department Jozef Stefan Institute Jamova cesta 39SI-1000 LjubljanaSlovenia Jozef Stefan International Postgraduate School Jamova cesta 39 SI-1000 LjubljanaSlovenia

K_(0.5)Na_(0.5)NbO_(3)-SrTiO_(3)(KNN-STO)thin films of different compositions were prepared by the chemical solution deposition *** structural investigations confirmed the formation of perovskite solid solution in all developed films,dieletric experiments revealed a relaxor broad dispersive maximum in the sample with 15 mol%of STO,exhibiting for a thin film high ε′~330 at~*** history-dependent effects of this relaxor sample were compared to those of KNN STO ceramics and,furthermore,shown to be much weaker than in widely used lead-based ferroelectric and relaxor(Pb,L a)(Zr,Ti)O_(3) ceramics:While fatigue endurance results revealed a slight drop in polarization after 3 × 10^(5) switching cycles,the results of aging of the dielectric constant revealed no notable decrease in its values after 10^(6)s.

关键词： Lead-free ceramic thin films relaxor ferroelectrics electrical fatigue and aging

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