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Transient near tip fields in crack dynamics

Science China(Physics,Mechanics & Astronomy) 2011年第7期54卷 1309-1318页

作者： BRATOV Vladimir PETROV Yuri utkin alexander Institute of Problems of Mechanical Engineering Russian Academy of SciencesSt.-Petersburg 199178Russia St.-Petersburg State University St.-Petersburg 198504Russia

Transient effects of stress-strain fields in the vicinity of a stationary crack tip under high rate loads are *** analytical solutions to near tip stresses are compared to fields prescribed by leading terms(one or several) of Williams asymptotic *** of load application mode,time(or,which is the same,distance from a crack tip) and Poisson's ratio on this discrepancy is extensively *** effects connected with crack tip propagation speed are also *** inconsistencies between real(or received in numerical solutions of state *** element computations) crack tip fields and stress intensity factor(SIF) singular field observed by numerous researchers are *** scope of problems where SIF field can be used for correct prediction of dynamic stress-strain fields in the crack tip region is *** to correctly approximate fields that are not SIF dominated,accounting additional terms of Williams expansion,is studied.

关键词： transient crack tip fields dynamic fracture high-rate loads asymptotic expansions

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Copper ion beam emission in solid electrolyte Rb_(4)Cu_(16)I_(6.5)Cl_(13.5)

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Chinese Physics B 2022年第4期31卷 239-243页

作者： Tushagu Abudouwufu Xiangyu Zhang Wenbin Zuo Jinbao Luo Yueqiang Lan Canxin Tian Changwei Zou alexander Tolstoguzov Dejun Fu Key Laboratory of Artificial Micro and Nanostructures of Ministry of Education and Hubei Key Laboratory of Nuclear Solid Physics School of Physics and TechnologyWuhan UniversityWuhan 430072China Shenzhen Institute of Wuhan University Shenzhen 518057China Zhuhai Tsinghua University Research Institute Innovation Center Zhuhai 519000China School of Physics and Technology Lingnan Normal UniversityZhanjiang 524048China utkin Ryazan State Radio Engineering University Ryazan 390005Russian Federation

Copper ion conducting solid electrolyte Rb_(4)Cu_(16)I_(6.5)Cl_(13.5)was prepared by means of mechano-chemical *** structure and morphology of the powder was investigated by x-ray diffraction and scanning electron *** grain size was estimated to be 0.2-0.9μm and the ionic conductivity at room temperature was approximately 0.206 S/*** solid electrolyte Rb_(4)Cu_(16)I_(6.5)Cl_(13.5)was exploited for copper ion beam *** copper ion emission current of several nA was successfully obtained at acceleration voltages of 15 kV and temperature of 197℃in vacuum of 2.1×10^(-4)Pa.A good linear correlation between the logarithmic ion current(logI)and the square root of the acceleration voltage(U_(acc))at high voltage range was obtained,suggesting the Schottky emission mechanism in the process of copper ion beam generation.

关键词： solid electrolyte mechano-chemical synthesis ion emission ion-beam source

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Copper ion beam emission in solid electrolyte Rb4Cu16I6.5Cl13.5

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Chinese Physics B 2022年第4期31卷 200-204页

作者：吐沙姑·阿不都吾甫张翔宇左文彬罗进宝兰越强田灿鑫邹长伟 alexander Tolstoguzov 付德君 Key Laboratory of Artificial Micro and Nanostructures of Ministry of Education and Hubei Key Laboratory of Nuclear Solid Physics School of Physics and TechnologyWuhan University Shenzhen Institute of Wuhan University Zhuhai Tsinghua University Research Institute Innovation Center School of Physics and Technology Lingnan Normal University utkin Ryazan State Radio Engineering University

Copper ion conducting solid electrolyte Rb4Cu16I6.5Cl13.5was prepared by means of mechano-chemical *** structure and morphology of the powder was investigated by x-ray diffraction and scanning electron *** grain size was estimated to be 0.2-0.9 μm and the ionic conductivity at room temperature was approximately 0.206 S/*** solid electrolyte Rb4Cu16I6.5Cl13.5was exploited for copper ion beam *** copper ion emission current of several nA was successfully obtained at acceleration voltages of 15 kV and temperature of 197℃ in vacuum of 2.1×10-4Pa.A good linear correlation between the logarithmic ion current(logI) and the square root of the acceleration voltage(Uacc)at high voltage range was obtained,suggesting the Schottky emission mechanism in the process of copper ion beam generation.

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