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Exploring fs-laser irradiation damage subthreshold behavior of dielectric mirrors via electrical measurements

High Power Laser Science and Engineering 2024年第2期12卷 24-32页

作者： petrisor gabriel bleotu Radu Udrea Alice Dumitru Olivier Uteza Maria-Diana Mihai Dan Gh Matei Daniel Ursescu Stefan Irimiciuc Valentin Craciun Extreme Light Infrastructure-Nuclear Physics(ELI-NP) Horia Hulubei National Institute for R&D in Physics and Nuclear Engineering(IFIN-HH)MagureleRomania Doctoral School of Physics University of BucharestMagureleRomania LULI-CNRS CEAUniversite SorbonneEcole PolytechniqueInstitut Polytechnique de ParisPalaiseau CEDEXFrance Apel Laser IlfovRomania Aix-Marseille University CNRSLP3 UMR 7341MarseilleFrance Horia Hulubei National Institute for R&D in Physics and Nuclear Engineering(IFIN-HH) MagureleRomania University Politehnica of Bucharest BucharestRomania National Institute for Lasers Plasma and Radiation Physics MagureleRomania

With ultrafast laser systems reaching presently 10 PW peak power or operating at high repetition rates,research towards ensuring the long-term,trouble-free performance of all laser-exposed optical components is *** work is focused on providing insight into the optical material behavior at fluences below the standardized laser-induced damage threshold(LIDT)value by implementing a simultaneous dual analysis of surface emitted particles using a Langmuir probe(LP)and the target current(TC).HfO_(2) and ZrO_(2) thin films deposited on fused silica substrates by pulsed laser deposition at various O_(2) pressures for defect and stoichiometry control were irradiated by Gaussian,ultrashort laser pulses(800 nm,10 Hz,70 fs)in a wide range of *** TC and LP collected signals were in good agreement with the existing theoretical description of laser–matter interaction at an ultrashort time *** approach for an in situ LIDT monitoring system provides measurable signals for below-threshold irradiation conditions that indicate the endurance limit of the optical surfaces in the single-shot energy scanning *** LIDT value extracted from the LP-TC system is in line with the multipulse statistical analysis done with ISO 21254-2:2011(E).The implementation of the LP and TC as on-shot diagnostic tools for optical components will have a significant impact on the reliability of next-generation ultrafast and high-power laser systems.

关键词： HfO_(2) in situ detection Langmuir probe laser-induced damage threshold target current ZrO_(2)

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