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Revealing complex optical phenomena through vectorial metrics

Advanced Photonics 2022年第2期4卷 59-67页

作者： Chao He Jintao Chang Patrick S.Salter Yuanxing Shen Ben Dai Pengcheng Li Yihan Jin Samlan Chandran Thodik Mengmeng Li Aziz Tariq Jingyu Wang jacopo antonello Yang Dong Ji Qi Jianyu Lin Daniel S.Elson Min Zhang Honghui He Hui Ma Martin J.Booth University of Oxford Department of Engineering ScienceOxfordUnited Kingdom Tsinghua University Department of PhysicsBeijingChina Tsinghua University Tsinghua Shenzhen International Graduate SchoolGuangdong Engineering Center of Polarization Imaging and Sensing TechnologyShenzhenChina The Chinese University of Hong Kong Department of StatisticsHong KongChina University Bordeaux CNRSLOMAUMR 5798TalenceFrance Mirpur University of Science and Technology Department of PhysicsMirpurPakistan Research Center for Intelligent Sensing Zhejiang LabHangzhouChina Imperial College London Hamlyn Centre for Robotic SurgeryLondonUnited Kingdom Shenzhen Second People’s Hospital Respiratory DepartmentShenzhenChina

Advances in vectorial polarization-resolved imaging are bringing new capabilities to applications ranging from fundamental physics through to clinical *** polarimetry requires determination of the Mueller matrix(MM)at every point,providing a complete description of an object’s vectorial *** forming a comprehensive representation,the MM does not usually provide easily interpretable information about the object’s internal *** simpler vectorial metrics are derived from subsets of the MM *** metrics permit extraction of signatures that provide direct indicators of hidden optical properties of complex systems,while featuring an intriguing asymmetry about what information can or cannot be inferred via these *** harness such characteristics to reveal the spin Hall effect of light,infer microscopic structure within laser-written photonic waveguides,and conduct rapid pathological diagnosis through analysis of healthy and cancerous *** provides new insight for the broader usage of such asymmetric inferred vectorial information.

关键词： polarization imaging vectorial metrics Mueller matrix

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Universal adaptive optics for microscopy through embedded neural network control

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Light(Science & Applications) 2023年第12期12卷 2597-2609页

作者： Qi Hu Martin Hailstone Jingyu Wang Matthew Wincott Danail Stoychev Huriye Atilgan Dalia Gala Tai Chaiamarit Richard M.Parton jacopo antonello Adam M.Packer Ilan Davis Martin J.Booth Department of Engineering Science University of OxfordOxfordUK Department of Biochemistry University of OxfordOxfordUK Department of Physiology Anatomyand GeneticsUniversity of OxfordOxfordUK

The resolution and contrast of microscope imaging is often affected by aberrations introduced by imperfect optical systems and inhomogeneous refractive structures in *** optics(AO)compensates these aberrations and restores diffraction limited performance.A wide range of AO solutions have been introduced,often tailored to a specific microscope type or *** now,a universal AO solution-one that can be readily transferred between microscope modalities-has not been *** propose versatile and fast aberration correction using a physics-based machine learning assisted wavefront-sensorless AO control(MLAO)*** previous ML methods,we used a specially constructed neural network(NN)architecture,designed using physical understanding of the general microscope image formation,that was embedded in the control loop of different microscope *** approach means that not only is the resulting NN orders of magnitude simpler than previous NN methods,but the concept is translatable across microscope *** demonstrated the method on a two-photon,a three-photon and a widefield three-dimensional(3D)structured illumination *** showed that the method outperformed commonly-used modal-based sensorless AO *** also showed that our ML-based method was robust in a range of challenging imaging conditions,such as 3D sample structures,specimen motion,low signal to noise ratio and activity-induced fluorescence ***,as the bespoke architecture encapsulated physical understanding of the imaging process,the internal NN configuration was no-longer a"black box",but provided physical insights on internal workings,which could influence future designs.

关键词： optics illumination correction

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