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Fast and reliable identification of atomically thin layers of TaSe2 crystals

Nano Research 2013年第3期6卷 191-199页

作者： Andres Castellanos-Gomez Efren Navarro-Moratalla Guillermo Mokry Jorge Quereda Elena Pinilla-Cienfuegos Nicolas Agrait Herre S. J. van der Zant eugenio coronado Gary A. Steele Gabino Rubio-Bollinger Kavli Institute of Nanoscience Delft University of Technology Lorentzweg 1 2628 CJ Delft The Netherlands Instituto Ciencia Molecular (ICMol) Univ. Valencia C/Catedrdtico Jose Beltrdn 2 E-46980 Paterna Spain Departamento de Fisica de la Materia Condensada (C-III). UniversidadAutonoma de Madrid Campus de Cantoblanco 28049 Madrid Spain Instituto Madrileno de Estudios Avanzados en Nanociencia IMDEA-Nanociencia E-28049 Madrid Spain

Deposition of clean and defect-free atomically thin two-dimensional crystalline flakes on surfaces by mechanical exfoliation of layered bulk materials has proven to be a powerful technique, but it requires a fast, reliable and non-destructive way to identify the atomically thin flakes among a crowd of thick flakes. In this work, we provide general guidelines to identify ultrathin flakes of TaSe2 by means of optical microscopy and Raman spectroscopy. Additionally, we determine the optimal substrates to facilitate the optical identification of atomically thin TaSe2 crystals. Experimental realization and isolation of ultrathin layers of TaSe2 enables future studies on the role of the dimensionality in interesting phenomena such as superconductivity and charge density waves.

关键词： atomically thin layer metal dichalcogenide layered superconductor TaSe2 optical microscopy Raman spectroscopy

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High-quality-factor tantalum oxide nanomechanical resonators by laser oxidation of TaSe2

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Nano Research 2015年第9期8卷 2842-2849页

作者： Santiago J. CartamiI-Bueno Peter G. Steeneken Frans D. Tichelaar Efren Navarro-Moratalla Warner J. Venstra Ronald van Leeuwen eugenio coronado Herre S.J. van der Zant Gary A. Steele Andres Castellanos-Gomez Kavli Institute of Nanoscience Delft University of Technology Lorentzweg 1 2628 CJ Delft The Netherlands Kavli Institute of Nanoscience Delft University of Technology National Centre for HREM Lorentzweg 1 2628 CJ Delft The Netherlands Instituto Ciencia Molecular (ICMol) Univ. Valencia C/Catedrdtico Jos@ Beltrdn 2 E-46980 Paterna Spain

Controlling the strain in two-dimensional （2D） materials is an interesting avenue to tailor the mechanical properties of nanoelectromechanical systems. Here, we demonstrate a technique to fabricate ultrathin tantalum oxide nanomechanical resonators with large stress by the laser oxidation of nano-drumhead resonators composed of tantalum diselenide （TaSe2）, a layered 2D material belonging to the metal dichalcogenides. Before the study of their mechanical properties with a laser interferometer, we verified the oxidation and crystallinity of the freely suspended tantalum oxide using high-resolution electron microscopy. We demonstrate that the stress of tantalum oxide resonators increases by 140 MPa （with respect to pristine TaSe2 resonators）, which causes an enhancement in the quality factor （14 times larger） and resonance frequency （9 times larger） of these resonators.

关键词： TaSe2,tantalum oxide,mechanical resonators,laser oxidation,optical interferometer,high quality factor

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