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Indentation Size Effect and Microhardness Study of β-Sn Single Crystals

Chinese Physics Letters 2005年第12期22卷 3137-3140页

作者： O. SAHIN O. UZUN U. KOLEMEN b. duzgun N. UCAR Department of Physics Art and Science Faculty Suleyman Demirel University Isparta Turkey Department of Physics Art and Science Faculty Gaziosmanpasa University Tokat Turkey Department of Physics K. K. Education Faculty Ataturk-University Erzurum Turkey

The load dependence of apparent microhardness of β-Sn single crystals having different growth directions is investigated. The measurements are performed on （110） planes of these crystals in the load range from 10 to 50 mN. It is found that the degree of the microhardness anisotropy decreases for higher indentation test loads. The examined materials exhib.t the b.haviour of indentation size effect （ISE）, i.e., the apparent hardness increases with decreasing indentation load. Neither Meyer＇s law nor the proportional specimen resistance （PSR） model can fully explain the nonlinear variation of microhardness with load. Instead, preference is given to modified the PSR model b.sed on the consideration of the effect of machining-induced residually stressed surface on the hardness measurement.

关键词： COb.LT-b.SED ALLOYS SILICON-NITRIDE STRUCTURAL-PROPERTIES KNOOPMICROHARDNESS b.SAL-PLANE HARDNESS CERAMICS ANISOTROPY PRESSURE SOLIDS

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Characteristic evaluation on spray-deposited WFTO thin films as a function of W doping ratio

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Rare Metals 2014年第4期33卷 433-441页

作者： G.Turgut E.F.Keskenler S.Aydin D.Tatar E.Sonmez S.Dogan b.duzgun Department of Physics Education Kazim Karabekir Education FacultyAtatürk University Department of Nanotechnology Faculty of EngineeringRecep Tayyip Erdogan University Department of Electrical and Electronics Engineering Faculty of Engineering and ArchitectureBalikesir University

Ab.tract In this work, F and F ＋ W simultaneously doped SnO2 highly transparent conducting thin films were depos- ited on glass sub.trates at （500 4± 5） ℃ temperature b. the spray pyrolysis method. Microstructural, morphological, electrical and optical properties of FrO films were investi- gated as a function of tungsten （W） doping, in the range from 0 to 5 at%. X-ray diffraction patterns show that the films exhib.t a tetragonal cassiterite structure and （200） preferen- tial orientation of FTO film, and the relative strength of these peaks changes with altering the W doping ratio. The pre- ferred growth of （211） changed to （200） plane with 2 at% W doping level and 3 at% W-doped film had （200） orientation and with further doping, this changed to （110） orientation. The scanning electron microscopy and atomic force microscopy images of the films indicate that the films are made up of dense small particles of a pyramidal shape and have a smooth surface. It was ob.erved that the surface morphology of the films did not change much when the W element was inserted to the FrO structure. It was found that the sheet resistance values of the films varied with W doping ratio, and 2 at% W-doped FTO thin film exhib.ted the lowest values of sheet resistance （1.12Ω）. Also, the highest figure of merit, infrared reflectivity and optical b.nd gap values werecalculated for 2 at% W-doped FTO film as 50.9× 10-2 Ω-1, 98.82 % and 4.13 eV, respectively. These results make the films an effective candidate for usage in many optoelectronic applications and photo-thermal conversion of solar energy.

关键词： WFTO FrO Spray pyrolysis Thin films Lattices

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