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Structural and optical characteristic features of RF sputtered CdS/ZnO thin films

Chinese Physics B 2020年第8期29卷 204-210页

作者： ateyyah m.al-baradi Fatimah A altowairqi A A Atta ali Badawi Saud A algarni Abdulraheem S A almalki A m Hassanien A alodhayb A m Kamal m m El-Nahass Department of Physics Faculty of ScienceTaif UniversityTaif 21974Saudi Arabia Department of Physics Faculty of EducationAin Shams UniversityRoxy 11757CairoEgypt Department of Chemistry Faculty of ScienceTaif UniversityTaifSaudi Arabia Department of Physics College of Science and Humanities-Al QuwaiiyahShaqra UniversitySaudi Arabia Research Chair for Tribology Surfaceand Interface SciencesDepartment of Physics and AstronomyCollege of ScienceKing Saud UniversityRiyadh 11451Saudi Arabia Department of Physics and Astronomy College of ScienceKing Saud UniversityRiyadh 11451Saudi Arabia

In this study,CdS/ZnO(2:3 mol%)thin films are successfully deposited on quartz substrates by using the sputtering *** images on the structural and optical characteristic features of CdS/ZnO thin films before and after annealing are *** CdS/ZnO thin films are annealed respectively at temperatures of 373 K,473 K,and 573 K and the structural features are examined by XRD,ATR-FTIR,and *** optical properties of CdS/ZnO thin films such as refractive indices,absorption coefficients,optical band gap energy values,Urbach energy values,lattice dielectric constants,and high frequency dielectric constants are determined from spectrophotometer data recorded over the spectral range of 300 nm-2500 *** parameters are investigated by using a single-oscillator *** spectra of CdS/ZnO thin films show an overall decrease in their intensity peaks after *** third-order nonlinear optical parameter,and nonlinear refractive index are also estimated.

关键词： CdS/ZnO thin films structural&optical properties

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Effect of Heat Treatment on the Nanoscale Structure and Optical Properties of Cd<sub>2</sub>SnO<sub>4</sub>Thin Films Deposited by RF magnetron Sputtering

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Journal of modern Physics 2015年第13期6卷 1803-1813页

作者： ateyyah m. al-baradi Department of Physics Taif University Taif Kingdom of Saudi Arabia

Cadmium tin oxide Cd2SnO4 thin films with a thickness of 228.5 nm were prepared by RF magnetron sputtering technique on glass substrates at room temperature. AFm has been utilized to study the morphology of these films as a function of annealing temperature at the nanoscale. The optical properties of these films, such as the transmittance, T(λ), and reflectance, R(λ), have been studied as a function of annealing temperature. The optical constants, such as optical energy gap, width of the band tails of the localized states, refractive index, oscillatory energy, dispersion energy, real and imaginary parts of both dielectric constant and optical conductivity have been found to be affected by changing the annealing temperature of the films.

关键词： Thin Films Atomic Force microscope Transmittance Reflectance Optical Energy Gap Optical Conductivity

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