咨询与建议

限定检索结果

文献类型

  • 1 篇 期刊文献

馆藏范围

  • 1 篇 电子文献
  • 0 种 纸本馆藏

日期分布

学科分类号

  • 1 篇 理学
    • 1 篇 物理学
    • 1 篇 化学
  • 1 篇 工学
    • 1 篇 材料科学与工程(可...

主题

  • 1 篇 materials
  • 1 篇 fused
  • 1 篇 chemistry

机构

  • 1 篇 department of ma...
  • 1 篇 mathematics and ...
  • 1 篇 the rowland inst...
  • 1 篇 department of el...
  • 1 篇 advanced photon ...
  • 1 篇 national center ...
  • 1 篇 department of ph...
  • 1 篇 dow chemical co....
  • 1 篇 applied physics ...
  • 1 篇 department of ma...
  • 1 篇 school of integr...

作者

  • 1 篇 ismail el baggar...
  • 1 篇 alyssa j.fielitz
  • 1 篇 zichao wendy di
  • 1 篇 jeffrey a.fessle...
  • 1 篇 richard d.robins...
  • 1 篇 robert hovden
  • 1 篇 yi jiang
  • 1 篇 sanjaya d.perera
  • 1 篇 colin ophus
  • 1 篇 jonathan schwart...
  • 1 篇 don-hyung ha
  • 1 篇 steve rozeveld

语言

  • 1 篇 英文
检索条件"作者=Zichao Wendy di"
1 条 记 录,以下是1-10 订阅
排序:
Imaging atomic-scale chemistry from fused multi-modal electron microscopy
收藏 引用
npj Computational Materials 2022年 第1期8卷 164-171页
作者: Jonathan Schwartz zichao wendy di Yi Jiang Alyssa J.Fielitz Don-Hyung Ha Sanjaya D.Perera Ismail El Baggari Richard D.Robinson Jeffrey A.Fessler Colin Ophus Steve Rozeveld Robert Hovden Department of Materials Science and Engineering University of MichiganAnn ArborMIUSA Mathematics and Computer Science division Argonne National LaboratoryLemontILUSA Advanced Photon Source Facility Argonne National LaboratoryLemontILUSA Dow Chemical Co. MidlandMIUSA Department of Material Science and Engineering Cornell UniversityIthacaNew YorkUSA School of Integrative Engineering Chung-Ang UniversitySeoulRepublic of Korea Department of Physics Cornell UniversityIthacaNYUSA The Rowland Institute at Harvard CambridgeMAUSA Department of Electrical Engineering and Computer Science University of MichiganAnn ArborMIUSA National Center for Electron Microscopy Lawrence Berkeley National LaboratoryMolecular FoundryBerkeleyCAUSA Applied Physics Program University of MIchiganAnn ArborMIUnited States
Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions.Here,fused multi-modal electron microscopy offers high signal-to-noi... 详细信息
来源: 维普期刊数据库 维普期刊数据库 评论