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Performance optimization of tri-gate junctionless FinFET using channel stack engineering for digital and analog/RF design

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Journal of Semiconductors 2023年第11期44卷 89-100页

作者： Devenderpal Singh shalini chaudhary Basudha Dewan Menka Yadav Department of Electronics and Communication Engineering Malaviya National Institute of TechnologyJaipurRajasthan-302017India

This manuscript explores the behavior of a junctionless tri-gate FinFET at the nano-scale region using SiGe material for the *** the analysis,three different channel structures are used:(a)tri-layer stack channel(TLSC)(Si-SiGe-Si),(b)double layer stack channel(DLSC)(SiGe-Si),(c)single layer channel(SLC)(S_(i)).The I−V characteristics,subthreshold swing(SS),drain-induced barrier lowering(DIBL),threshold voltage(V_(t)),drain current(ION),OFF current(IOFF),and ON-OFF current ratio(ION/IOFF)are observed for the structures at a 20 nm gate *** is seen that TLSC provides 21.3%and 14.3%more ON current than DLSC and SLC,*** paper also explores the analog and RF factors such as input transconductance(g_(m)),output transconductance(gds),gain(gm/gds),transconductance generation factor(TGF),cut-off frequency(f_(T)),maximum oscillation frequency(f_(max)),gain frequency product(GFP)and linearity performance parameters such as second and third-order harmonics(g_(m2),g_(m3)),voltage intercept points(VIP_(2),VIP_(3))and 1-dB compression points for the three *** results show that the TLSC has a high analog performance due to more gm and provides 16.3%,48.4%more gain than SLC and DLSC,respectively and it also provides better *** the results are obtained using the VisualTCAD tool.

关键词： short channel effects(SCEs) junctionless FinFET analog and RF parameters SiGe

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Staphylococcal bullous impetigo in a neonate

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World Journal of Clinical Cases 2016年第7期4卷 191-194页

作者： shalini Dewan Duggal Tanisha Bharara Pragnya Paramita Jena Avinash Kumar Abha Sharma Renu Gur Sanjay chaudhary Department of Microbiology Dr Baba Saheb Ambedkar Hospital Department of Pediatrics Dr Baba Saheb Ambedkar Hospital

An otherwise healthy, full-term neonate presented at day 15 of life to the pediatric emergency with generalized papulo-pustular rash for 2 d. This was finally diagnosed as bullous impetigo caused by Staphylococcus aureus(S. aureus). The skin lesions decreased significantly after starting antibiotic therapy and drainage of blister fluid. There was no recurrence of the lesions on followup. This case of generalized pustular eruption due to S. aureus in a neonate is reported, as it poses a diagnostic dilemma and can have serious consequences if left untreated.

关键词： Pustular lesions Staphylococcus aureus Bullous impetigo

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