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Flip-flops soft error rate evaluation approach considering internal single-event transient

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Science China(Information Sciences) 2015年第6期58卷 159-170页

作者： song ruiqiang CHEN ShuMing HE YiBai DU YanKang College of Computer Science National University of Defense Technology Science and Technology on Parallel and Distributed Processing Laboratory

The internal single-event transient(SET) induced upset in flip-flops is becoming significant with the increase of the operating frequency. However, the conventional soft error rate(SER) evaluation approach could only produce an approximate upset prediction result caused by the internal SET. In this paper, we propose an improved SER evaluation approach based on Monte Carlo simulation. A novel SET-based upset model is implemented in the proposed evaluation approach to accurately predict upsets caused by the internal SET. A test chip was fabricated in a commercial 65 nm bulk process to validate the accuracy of the improved SER evaluation approach. The predicted single-event upset cross-sections are consistent with the experimental data.

关键词： soft error rate Monte Carlo internal SET single-event upset flip-flops

Modeling the impact of process and operation variations on the soft error rate of digital circuits

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Science China(Information Sciences) 2017年第12期60卷 286-288页

作者： ruiqiang song Shuming CHEN Bin LIANG Yaqing CHI Jianjun CHEN College of Computer National University of Defense Technology

Dear editor,Process or operation variations are important factors in the soft error rate(SER)of integrated circuits[1,2].During manufacturing or other operations,inevitable process or operation variations lead to changes in the electrical parameters of transistors,which can result in sizeable shifts in the SER of integrated circuits[3].Some studies have reported that the hardness of test chips can vary by more than 20%as a result of process or operation variations[4].Therefore,it is vital to account

关键词： Modeling the impact of process and operation variations on the soft error rate of digital circuits

Comparison of single-event upset generated by heavy ion and pulsed laser

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Science China(Information Sciences) 2017年第7期60卷 243-251页

作者： Bin LIANG ruiqiang song Jianwei HAN Yaqing CHI Rui CHEN Chunmei HU Jianjun CHEN Yingqi MA Shipeng SHANGGUAN College of Computer National University of Defense Technology Center for Space Science and Applied Research Chinese Academy of Sciences

Single-event upset(SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation results show that the beam spot size significantly impacts SEU cross sections in both low and high laser energy while the variation of the equivalent LET only impacts SEU cross sections in the low laser energy.

关键词： single-event upset charge sharing cross sections heavy ion pulsed laser

An evaluation method for nuclear radiation detection performance of glass scintillator

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Radiation Detection Technology and Methods 2024年第2期8卷 1107-1119页

作者： Zhehao Hua Sen Qian Hua Cai Dejing Du Ruirui Fan Jifeng Han Chen Hu Peng Hu Shan Liu Yong Liu Lishuang Ma Laishun Qin Jing Ren ruiqiang song Zexuan Sui Xilei Sun Xinyuan Sun Gao Tang Zhigang Wang Qi Wu Dong Yang Lirong Zheng Yao Zhu Institute of High Energy Physics Chinese Academy of SciencesBeijing 100049China State Key Laboratory of Particle Detection and Electronics Beijing 100049China China Building Materials Academy Beijing 100024China Spallation Neutron Source Science Center(SNSSC) Dongguan 523803China Institute of Nuclear Science and Technology Sichuan UniversityChengdu 610064China Shanghai Institute of Ceramics Chinese Academy of SciencesShanghai 201899China Beijing Glass Research Institute Beijing 101111China College of Materials and Chemistry China Jiliang UniversityHangzhou 310018China College of Physics and Optoelectronic Engineering Harbin Engineering UniversityHarbin 150001China Department of Physics Jinggangshan UniversityJi'an 343009China

Purpose Glass is a potential choice for the scintillator in Hadronic calorimetry(HCAL)of the *** requires sophisticated instruments and suitable methods to obtain scintillation properties of the glasses in the first *** is necessary to establish an evaluation method for nuclear radiation detection performance of glass *** The spectroscopy research of the glass includes transmission/absorption spectrum and emission *** time characteristics include rise time,scintillation decay time and *** scintillation properties include light yield,energy resolution and minimum ionizing particle(MIP)*** a new method for measuring the low light yield of glass scintillators is *** We have built a complete performance test system and evaluation method,which can evaluate the nuclear radiation detection performance of different glass *** By continuously improving the composition and preparation process of the glass,it can provide potential possibilities for the application in the high-energy physics experiment and nuclear radiation detection fields.

关键词： CEPC Calorimeter Glass scintillator Scintillation Nuclear radiation detection

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岩棉夹芯板力学性能的有限元分析

工业建筑 2008年第Z1期38卷 479-482,462页

作者：宋瑞强查晓雄邹杰哈尔滨工业大学深圳研究生院深圳518088

彩钢岩棉夹芯板作为新型的建筑保温隔热材料被广泛使用。但是由于缺乏对其力学性能的系统性研究,使得在不同荷载、不同跨度下该如何选用板厚存在极大的困难,阻碍了夹芯板的应用及发展。通过有限元软件ABAQOS对彩钢岩棉夹芯板力学性能进... 详细信息

彩钢岩棉夹芯板作为新型的建筑保温隔热材料被广泛使用。但是由于缺乏对其力学性能的系统性研究,使得在不同荷载、不同跨度下该如何选用板厚存在极大的困难,阻碍了夹芯板的应用及发展。通过有限元软件ABAQOS对彩钢岩棉夹芯板力学性能进行较系统的分析,得到影响岩棉夹芯板承载力参数:剪力分配系数,并通过试验来验证分析结果。在此基础上提出了不同跨度及荷载作用下的板厚度选用表格,给设计工作带来很大程度的简化和方便。

关键词：岩棉夹芯板剪力分配系数有限元极限承载力

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TOC分析仪在COD监测中的应用

仪器仪表与分析监测 2022年第2期 20-24页

作者：宋瑞强滨州市海洋发展研究院山东滨州256600

TOC分析仪测定COD具有检出限低、操作简便迅速、不受氯离子干扰、实验过程不产生新增污染的优点,无论是方法的线性、检出限、测定下限,还是精密度、准确度、加标回收率等各项特性指标均能达到预期要求,有利于实现对水中COD快速检测。

关键词： TOC分析仪 COD 监测应用

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利用脉冲激光的片上系统芯片单粒子效应试验

国防科技大学学报 2017年第2期39卷 134-139页

作者：胡春媚陈书明吴振宇宋睿强池雅庆国防科技大学计算机学院湖南长沙410073 国防科技大学并行与分布处理重点实验室湖南长沙410073

为评估脉冲激光试验对研究SoC(片上系统芯片)单粒子效应的有效性,构建了一个65 nm SoC的脉冲激光试验系统,并进行了试验。提出并采用坐标定位法、有源区聚焦法、ΔZ补偿法等针对大规模倒装焊集成电路的试验方法。对SoC的片上存储器、寄... 详细信息

为评估脉冲激光试验对研究SoC(片上系统芯片)单粒子效应的有效性,构建了一个65 nm SoC的脉冲激光试验系统,并进行了试验。提出并采用坐标定位法、有源区聚焦法、ΔZ补偿法等针对大规模倒装焊集成电路的试验方法。对SoC的片上存储器、寄存器文件、RapidIO、DICE触发器等部件进行了脉冲激光试验和分析。结果表明:片上存储器对脉冲激光最为敏感,部件的激光试验与相应的重离子试验现象吻合,利用脉冲激光试验可有效研究纳米工艺下大规模集成电路的单粒子效应。

关键词：脉冲激光单粒子效应聚焦平面单粒子翻转单粒子功能中断

氧化还原容量法测定海洋沉积物中有机碳的主要影响因子及消除方法

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仪器仪表与分析监测 2019年第1期 36-39页

作者：宋瑞强滨州市海洋环境监测站山东滨州256600

采用大容量试管,并按照加入磷酸-静置24小时-加入硫酸汞-加入重铬酸钾-加入硫酸-硫酸银溶液的顺序,可以消除海洋沉积物中有机碳测定过程中碳酸根、氯离子的影响,并防止暴沸现象产生。方法对海洋沉积物有机碳监测标准GB17378.5-2007/18.... 详细信息

采用大容量试管,并按照加入磷酸-静置24小时-加入硫酸汞-加入重铬酸钾-加入硫酸-硫酸银溶液的顺序,可以消除海洋沉积物中有机碳测定过程中碳酸根、氯离子的影响,并防止暴沸现象产生。方法对海洋沉积物有机碳监测标准GB17378.5-2007/18.1重铬酸钾氧化还原容量法进行了合理改进,重复性好、精密度高,对国家标准物质进行验证,证明本方法可靠。

关键词：氧化还原容量法海洋沉积物有机碳影响因子

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低浓度样品测定时回归曲线中截距的处理

福建分析测试 2015年第3期24卷 28-30页

作者：宋瑞强国家海洋局滨州海洋环境监测站山东滨州256600

截距对低浓度样品计算却影响甚大,尤其是当样品浓度接近空白浓度时,用线性回归方程计算时会出现偏差。通过计算统计量判定回归曲线是否过原点、计算容许值判定离群值是否异常及通过Origin的线性拟合功能强制过原点,可以有效避免因线性... 详细信息

截距对低浓度样品计算却影响甚大,尤其是当样品浓度接近空白浓度时,用线性回归方程计算时会出现偏差。通过计算统计量判定回归曲线是否过原点、计算容许值判定离群值是否异常及通过Origin的线性拟合功能强制过原点,可以有效避免因线性拟合过程中导致的计算误差,从而保证低浓度样品测定结果的准确性。

关键词：低浓度样品回归曲线截距